issue contents
May 2014 issue
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Cover illustration: The calculated distribution of X-ray intensities obtained from rocking a crystal plane about two orthogonal axes. The central peak represents the specular condition. The inset illustrates the capture area for a typical Bragg-Brentano diffractometer. Image from A new theory for X-ray diffraction by Paul F. Fewster [Acta Cryst. (2014), A70, 257-282].
mathematical crystallography
research papers
foundations
research papers
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international union of crystallography
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book reviews
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