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Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 1| Part 1
ISSN: 1600-5767

April 1968 issue

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J. Appl. Cryst. (1968). 1, 1-19
, https://doi.org/10.1107/S0021889868004930
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A test object and criteria for high resolution electron microscopy

R. D. Heidenreich, W. M. Hess and L. L. Ban
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J. Appl. Cryst. (1968). 1, 19-23
, https://doi.org/10.1107/S0021889868004942
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Direct method for unfolding convolution products - its application to X-ray scattering intensities

S. Ergun
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J. Appl. Cryst. (1968). 1, 23-30
, https://doi.org/10.1107/S0021889868004954
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Appareillage pour études radiocristallographiques sous pression et à température variable

R. Fourme
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J. Appl. Cryst. (1968). 1, 30-35
, https://doi.org/10.1107/S0021889868004966
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The metastable system Ga-Al and the atomic volume of twelvefold coordinated Ga

B. C. Giessen, U. Wolff and N. J. Grant
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J. Appl. Cryst. (1968). 1, 35-48
, https://doi.org/10.1107/S0021889868004978
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Relationships between interlayer spacing, stacking order and crystallinity in carbon materials

B. P. Richards
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J. Appl. Cryst. (1968). 1, 48-59
, https://doi.org/10.1107/S002188986800498X
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The variance and other measures of line broadening in powder diffractometry. I. Practical considerations

J. I. Langford
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notes and news

J. Appl. Cryst. (1968). 1, 59
, https://doi.org/10.1107/S0021889868004991
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Notes and News

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book reviews

J. Appl. Cryst. (1968). 1, 60
, https://doi.org/10.1107/S0021889868005005
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Théorie Mathématique des Dislocations by M. Zorawski

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