Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 1
|
Part 3
ISSN: 1600-5767
September 1968 issue
research papers
J. Appl. Cryst.
(1968).
1
,
131-138
doi: 10.1107/S0021889868005182
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The variance and other measures of line broadening in powder diffractometry. II. Determination of particle size
J. I. Langford
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J. Appl. Cryst.
(1968).
1
,
139-145
doi: 10.1107/S0021889868005194
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Strain inhomogeneities in lightly compressed tungsten crystals
B. A. Newman
and
S. Weissmann
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J. Appl. Cryst.
(1968).
1
,
145-153
doi: 10.1107/S0021889868005200
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The analysis of epitaxic growth layers of silicon carbide by X-ray diffraction topography
B. J. Isherwood
and
C. A. Wallace
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J. Appl. Cryst.
(1968).
1
,
153-165
doi: 10.1107/S0021889868005212
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Interprétation de la diffusion centrale des rayons X par les systèmes poreux. I
J. Méring
and
D. Tchoubar
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J. Appl. Cryst.
(1968).
1
,
165-171
doi: 10.1107/S0021889868005224
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X-ray diffraction contrast of inversion twin boundaries in BeO crystals
J.-I. Chikawa
and
S. B. Austerman
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J. Appl. Cryst.
(1968).
1
,
172-175
doi: 10.1107/S0021889868005236
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Etching of synthetic barite (BaSO
4
) single crystals
A. R. Patel
and
J. Koshy
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J. Appl. Cryst.
(1968).
1
,
176-178
doi: 10.1107/S0021889868005248
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A small set of reference crystals for double-crystal topography
R. D. Deslattes
and
B. Paretzkin
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J. Appl. Cryst.
(1968).
1
,
178-181
doi: 10.1107/S002188986800525X
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Une méthode générale pour l'indexation des diagrammes de poudres
D. Taupin
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J. Appl. Cryst.
(1968).
1
,
181-184
doi: 10.1107/S0021889868005261
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Mise en évidence de la dispersion anormale par mesure de l'indice d'un prisme à l'aide de la double diffraction des rayons X
C. Malgrange
,
E. Velu
and
A. Authier
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J. Appl. Cryst.
(1968).
1
,
184-186
doi: 10.1107/S0021889868005273
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Auswirkung elastischer Anisotropie auf die Kontrastfelder bei röntgentopographischer Abbildung von Oxydfilmkanten auf Silizium
U. Wattenberg
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J. Appl. Cryst.
(1968).
1
,
187-189
doi: 10.1107/S0021889868005285
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The variation of the lattice parameter of the solid solutions of lithium oxide in nickel oxide
C. J. Toussaint
and
G. Vos
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J. Appl. Cryst.
(1968).
1
,
190-193
doi: 10.1107/S0021889868005297
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Suppression de l'effet de texture sur la mesure de l'intensité diffractée. Dosage de l'austenite residuelle dans les aciers laminés
J. Manenc
and
A. Carel
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short communications
J. Appl. Cryst.
(1968).
1
,
194
doi: 10.1107/S0021889868005303
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Crystal data of La
5
Ge
3
C
1.5
I. Mayer
and
I. Shidlovsky
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J. Appl. Cryst.
(1968).
1
,
194-196
doi: 10.1107/S0021889868005315
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On variance as a measure of line broadening in diffractometry: effect of a distribution of sizes on the apparent crystallite size
A. J. C. Wilson
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notes and news
J. Appl. Cryst.
(1968).
1
,
196-197
doi: 10.1107/S0021889868005327
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books received
J. Appl. Cryst.
(1968).
1
,
198
doi: 10.1107/S0021889868005339
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Stereology. Proceedings of the Second International Congress for Stereology, Chicago, April 8-13, 1967
edited by H. Elias
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J. Appl. Cryst.
(1968).
1
,
198
doi: 10.1107/S0021889868005340
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Static electrification. Proceedings of the conference organized by the Institute of Physics and the Physical Society Static Electrification Group
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