Journal of Applied Crystallography
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Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 1
|
Part 4
ISSN: 1600-5767
November 1968 issue
research papers
J. Appl. Cryst.
(1968).
1
,
199-208
doi: 10.1107/S0021889868005352
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The structure of vapor-quenched Ag–Ge films
T. B. Light
and
C. N. J. Wagner
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J. Appl. Cryst.
(1968).
1
,
209-217
doi: 10.1107/S0021889868005364
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On choosing off-line automatic X-ray diffractometers
M. F. Davis
,
C. Groter
and
H. F. Kay
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J. Appl. Cryst.
(1968).
1
,
218-226
doi: 10.1107/S0021889868005376
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Graphitation partielle de quelques carbones durs. Etude en microscopie et microdiffraction électroniques
A. Oberlin
and
F. Rousseaux
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J. Appl. Cryst.
(1968).
1
,
227-233
doi: 10.1107/S0021889868005388
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Quantitative investigation of domain structures by Berg–Barrett X-ray diffraction microscopy. I. Determination of small tilt angles in various lattice planes of the crystal
K. Kranjc
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J. Appl. Cryst.
(1968).
1
,
234-241
doi: 10.1107/S002188986800539X
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X-ray diffraction and structure of water
W. Bol
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J. Appl. Cryst.
(1968).
1
,
241-246
doi: 10.1107/S0021889868005406
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Characterization of phases in the 50–60 at. % Te region of the Bi–Te system by X-ray powder diffraction patterns
R. F. Brebrick
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J. Appl. Cryst.
(1968).
1
,
246-249
doi: 10.1107/S0021889868005418
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Low-temperature thermal expansion of LiH, MgO and CaO
D. K. Smith
and
H. R. Leider
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J. Appl. Cryst.
(1968).
1
,
249-252
doi: 10.1107/S002188986800542X
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Density determination of small solid samples using a modified flotation method and a re-determination of the density of saturated aqueous thallous formate solutions
A. Taylor
and
N. J. Doyle
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J. Appl. Cryst.
(1968).
1
,
252-254
doi: 10.1107/S0021889868005431
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The effect of preferred orientation on (
hk
) interferences as shown by electron diffraction of carbon fibres
A. Fourdeux
,
R. Perret
and
W. Ruland
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J. Appl. Cryst.
(1968).
1
,
255-257
doi: 10.1107/S0021889868005443
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The effect of multiple diffraction on the determination of electron density distributions
D. Panke
and
E. Wölfel
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J. Appl. Cryst.
(1968).
1
,
257-262
doi: 10.1107/S0021889868005455
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Profile analysis of random-layer lines
R. Perret
and
W. Ruland
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J. Appl. Cryst.
(1968).
1
,
262
doi: 10.1107/S0021889868005467
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