Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 4
|
Part 4
ISSN: 1600-5767
August 1971 issue
research papers
J. Appl. Cryst.
(1971).
4
,
277-283
doi: 10.1107/S0021889871006976
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Influence of neglected small-angle scattering in radial distribution function analysis
G. S. Cargill III
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J. Appl. Cryst.
(1971).
4
,
284-290
doi: 10.1107/S0021889871006988
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Application of normal probability plot analysis to lutetium orthoborate factors and parameters
S. C. Abrahams
,
J. L. Bernstein
and
E. T. Keve
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J. Appl. Cryst.
(1971).
4
,
290-293
doi: 10.1107/S002188987100699X
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Small-angle X-ray scattering from helical macromolecules
O. A. Pringle
and
P. W. Schmidt
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J. Appl. Cryst.
(1971).
4
,
293-297
doi: 10.1107/S0021889871007003
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A high-temperature X-ray diffraction study of the NiO–Li
2
O system
C. J. Toussaint
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J. Appl. Cryst.
(1971).
4
,
297-302
doi: 10.1107/S0021889871007015
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A new film instrument for the exploration of reciprocal space
E. R. Wölfel
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J. Appl. Cryst.
(1971).
4
,
303-310
doi: 10.1107/S0021889871007027
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The development of the rolling texture in copper measured by neutron diffraction
H. J. Bunge
,
J. Tobisch
and
W. Sonntag
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J. Appl. Cryst.
(1971).
4
,
311-316
doi: 10.1107/S0021889871007039
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Analysis of powder diffraction patterns of monoclinic and triclinic crystals
T. Ishida
and
Y. Watanabe
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J. Appl. Cryst.
(1971).
4
,
317-318
doi: 10.1107/S0021889871007040
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Determination of small alterations in the radius of gyration by small-angle X-ray scattering
I. Simon
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short communications
J. Appl. Cryst.
(1971).
4
,
319-321
doi: 10.1107/S0021889871007052
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The non-additivity and curvature corrections in the variance method of X-ray line-broadening analysis
H. J. Edwards
and
K. Toman
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J. Appl. Cryst.
(1971).
4
,
321-324
doi: 10.1107/S0021889871007064
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Réalisation de canevas stéréographiques pour l'interprétation de figures de pôles
D. Ruer
and
R. Baro
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J. Appl. Cryst.
(1971).
4
,
324-326
doi: 10.1107/S0021889871007076
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A multi-wavelength neutron monochromator system
M. J. Cooper
and
J. B. Forsyth
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J. Appl. Cryst.
(1971).
4
,
326-328
doi: 10.1107/S0021889871007088
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X-ray diffraction data on U
3
Si
R. R. Boucher
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J. Appl. Cryst.
(1971).
4
,
328-329
doi: 10.1107/S002188987100709X
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The convergence of the van Cittert method of deconvolution
W. Ruland
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J. Appl. Cryst.
(1971).
4
,
329-330
doi: 10.1107/S0021889871007106
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Stacking disorder in martensite with 3
R
close-packed structure
S. Kajiwara
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J. Appl. Cryst.
(1971).
4
,
331-332
doi: 10.1107/S0021889871007118
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A device for in situ α-irradiation of diffractometer mounted single crystals
W. A. Denne
,
S. Janky
and
R. Venn
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computer programs
J. Appl. Cryst.
(1971).
4
,
332-333
doi: 10.1107/S002188987100712X
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Profile-analysis computer program
H. J. Edwards
and
K. Toman
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laboratory notes
J. Appl. Cryst.
(1971).
4
,
333
doi: 10.1107/S0021889871007131
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Apparatus for growth of crystals for X-ray diffraction study
H. Hope
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J. Appl. Cryst.
(1971).
4
,
334
doi: 10.1107/S0021889871099977
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Optical properties of thiourea
J. W. Jeffery
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J. Appl. Cryst.
(1971).
4
,
334-335
doi: 10.1107/S0021889871099965
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A modified design of a metal ribbon furnace for high temperature X-ray diffraction
K. Jenssen
and
J. Krogh-Moe
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J. Appl. Cryst.
(1971).
4
,
335
doi: 10.1107/S0021889871099953
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A method for encapsulating specimens of Yb and Ca-Yb alloys for X-ray diffraction examination
F. X. Kayser
and
G. L. Stowe
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international union of crystallography
J. Appl. Cryst.
(1971).
4
,
336
doi: 10.1107/S0021889871007143
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Acta Crystallographica
and
Journals of Applied Crystallography
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crystallographers
J. Appl. Cryst.
(1971).
4
,
336
doi: 10.1107/S0021889871007155
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