Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 4
|
Part 3
ISSN: 1600-5767
June 1971 issue
research papers
J. Appl. Cryst.
(1971).
4
,
185-190
doi: 10.1107/S0021889871006666
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Measurements of absolute reflectivities of mosaic crystals and their wavelength dependence
B. Dorner
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J. Appl. Cryst.
(1971).
4
,
190-193
doi: 10.1107/S0021889871006678
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X-ray line broadening by porous crystals
W. G. Spencer
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J. Appl. Cryst.
(1971).
4
,
193-196
doi: 10.1107/S002188987100668X
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Charts for analysing crystallite orientation distribution function plots for hexagonal materials
G. J. Davies
,
D. J. Goodwill
and
J. S. Kallend
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J. Appl. Cryst.
(1971).
4
,
196-201
doi: 10.1107/S0021889871006691
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A graphic display program for crystal structure illustrations
A. G. Nord
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J. Appl. Cryst.
(1971).
4
,
201-204
doi: 10.1107/S0021889871006708
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Precision determination of lattice parameters at low temperatures without the use of liquid gases
C. L. Woodard
and
M. E. Straumanis
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J. Appl. Cryst.
(1971).
4
,
204-207
doi: 10.1107/S002188987100671X
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A masked film cassette for utilization of the multiple film technique in precession photography
B. J. Wuensch
and
R. L. Thomas Jnr
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J. Appl. Cryst.
(1971).
4
,
207-209
doi: 10.1107/S0021889871006721
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Production of pits and hillocks on (111) faces of synthetic diamond by etching
A. R. Patel
and
T. C. Patel
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J. Appl. Cryst.
(1971).
4
,
210-223
doi: 10.1107/S0021889871006733
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Application of spline functions to the correction of resolution errors in small-angle scattering
J. Schelten
and
F. Hossfeld
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J. Appl. Cryst.
(1971).
4
,
224-231
doi: 10.1107/S0021889871006745
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Intersect distributions and small-angle X-ray scattering theory
H.-I. Wu
and
P. W. Schmidt
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J. Appl. Cryst.
(1971).
4
,
232-240
doi: 10.1107/S0021889871006757
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A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns
N. Harris
and
A. J. Kirkham
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J. Appl. Cryst.
(1971).
4
,
240-241
doi: 10.1107/S0021889871006769
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An X-ray diffraction method for lattice parameter measurements from corresponding
K
α and
K
β reflexions
S. Popović
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J. Appl. Cryst.
(1971).
4
,
242-250
doi: 10.1107/S0021889871006770
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The precise determination of the lattice parameter of α-iron and some of its alloys
A. Lutts
and
P. Gielen
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short communications
J. Appl. Cryst.
(1971).
4
,
251-252
doi: 10.1107/S0021889871006782
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Scanning source X-ray topography
A. D. Milne
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J. Appl. Cryst.
(1971).
4
,
252-254
doi: 10.1107/S0021889871006794
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Double diffraction between Bragg reflections and planes of diffuse intensity observed with high energy electron diffraction
S. L. Sass
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J. Appl. Cryst.
(1971).
4
,
254-255
doi: 10.1107/S0021889871006800
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A self-regulating mini-cooler for three-dimensional single-crystal neutron-diffraction measurements
F. R. Ebdon
and
D. A. Wheeler
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J. Appl. Cryst.
(1971).
4
,
256
doi: 10.1107/S0021889871006812
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Crystallographic data for an orthorhombic form of rubrene
D. E. Henn
,
W. G. Williams
and
D. J. Gibbons
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J. Appl. Cryst.
(1971).
4
,
257-259
doi: 10.1107/S0021889871006824
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A metastable phase TiCu
3
(
m
)
B. C. Giessen
and
D. Szymanski
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computer programs
J. Appl. Cryst.
(1971).
4
,
259-260
doi: 10.1107/S0021889871006836
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Powder pattern programs
J. I. Langford
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J. Appl. Cryst.
(1971).
4
,
260-261
doi: 10.1107/S0021889871006848
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A computer program for inverse pole figure statistics
W. Dubroff
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crystal data
J. Appl. Cryst.
(1971).
4
,
261-262
doi: 10.1107/S002188987100685X
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New crystal data on dioxygenyl tetrafluoroborate, O
2
BF
4
J. N. Wilson
,
R. M. Curtis
and
C. T. Goetschel
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laboratory notes
J. Appl. Cryst.
(1971).
4
,
263
doi: 10.1107/S0021889871006861
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A fast and efficient technique for fixing specimens to electron microscope grids
C. J. Ryan
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J. Appl. Cryst.
(1971).
4
,
263-264
doi: 10.1107/S0021889871099941
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Cooling apparatus for a single-crystal X-ray diffractometer
F. van Bolhuis
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international union of crystallography
J. Appl. Cryst.
(1971).
4
,
264-268
doi: 10.1107/S0021889871006873
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Commission on Crystallographic Computing
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J. Appl. Cryst.
(1971).
4
,
268-269
doi: 10.1107/S0021889871007660
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Commission on Crystallographic Apparatus
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notes and news
J. Appl. Cryst.
(1971).
4
,
269
doi: 10.1107/S0021889871006885
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Notes and News
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crystallographers
J. Appl. Cryst.
(1971).
4
,
269
doi: 10.1107/S0021889871006897
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Crystallographers
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book reviews
J. Appl. Cryst.
(1971).
4
,
270
doi: 10.1107/S0021889871006903
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Crystal growth in gels
by H. K. Henisch
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J. Appl. Cryst.
(1971).
4
,
270
doi: 10.1107/S0021889871006915
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Diffusion processes in iron alloys
by M. A. Krishtal
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J. Appl. Cryst.
(1971).
4
,
270-271
doi: 10.1107/S0021889871006927
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Diffusion processes in metals
edited by V. N. Svechnikov
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J. Appl. Cryst.
(1971).
4
,
271
doi: 10.1107/S0021889871006939
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Micron - The International Journal of Electron Microscopy, Electon Probe Micro-analysis and Associated Techniques
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J. Appl. Cryst.
(1971).
4
,
271
doi: 10.1107/S0021889871006940
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Principles of structural metallurgy
by B. Harcopos
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J. Appl. Cryst.
(1971).
4
,
271-272
doi: 10.1107/S0021889871006952
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An outline of crystal morphology
by A. C. Bishop
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meeting reports
J. Appl. Cryst.
(1971).
4
,
272-276
doi: 10.1107/S0021889871006964
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