Journal of Applied Crystallography Journal of Applied
Crystallography

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issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 5| Part 1

ISSN: 1600-5767

February 1972 issue

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research papers

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The effect of multiple scattering on structural parameters determined from X-ray small-angle scattering

W. Ruland and H. Tompa

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Die Entwicklung eines Messverfahrens für Röntgenintensitäten auf photographischem Wege

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On the existence of copper cobaltite

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Programme en FORTRAN IV pour l'analyse des données expérimentales relatives à la diffusion des rayons X par des substances liquides, amorphes et microcristallisées

M. Magini and A. Cabrini

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X-ray diffraction measurements of the cation distributions in spinel structures

G. Fagherazzi and F. Garbassi

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Measurements of centroid and peak shifts due to dispersion and the Lorentz factor at very high Bragg angles

C. J. Gillham and H. W. King

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The texture transition in α-brasses determined by neutron diffraction

H. J. Bunge and J. Tobisch

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Experimental verification of small-angle X-ray scattering collimation corrections

I. S. Patel and P. W. Schmidt

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Détermination des paramètres des mailles élémentaires de composés definis des systèmes Pu–Cu, Pu–Ga–Cu, et Pu–Ga–Ni

F. Pons, B. Barbe and C. Roux

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crystal data

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New crystal data for some hydrated alkali chloranilates M₂(C₆Cl₂O₄).nH₂O (n=1,2,3, or 4)

F. H. Herbstein and M. Kaftory

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book reviews

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Lasers edited by A. K. Levine and A. J. De Maria

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The growth of single crystals by R. A. Laudise

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laboratory notes

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A double-scan method for powder X-ray diffraction film

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Attachment for motorized rotation about the polar axis of a goniostat

P. R. Prager and Z. Barnea

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Eine Präzisionshalterung fü Röntgenmonochromatoren hoher Auflösung

F. Frey, K. L. Weiner and K. H. Wiechers

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notes and news

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Notes and News

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crystallographers

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Crystallographers

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