Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 5| Part 2

ISSN: 1600-5767

April 1972 issue

research papers

The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines

R. W. Cheary and N. W. Grimes

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The measurement of the lattice parameters of molybdenum ditelluride

M. K. Agarwal and M. J. Capers

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FIGATOM: a new graphic program for stereoscopic crystal structure illustrations

G. A. Langlet

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Crystal perfection and silver electromigration in α-quartz

S. Keerti and A. R. Lang

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Eigenschaften und Herstellung gebogener Kupfermonochromatoren für thermische Neutronen

P. Thomas

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Modifizierte Laue-Methode für thermische Neutronen

P. Thomas

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A simple globe and cap method for orienting cubic-symmetry crystals using Laue photographs

S. Hart

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K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnost po uglam rasseyaniya, obuslovlennoy faktorami dispernosti i formi oblastey kogerentnogo rasseyaniya

G. V. Davydov and G. M. Bartenev

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K voprosu o kharakternikh tochkakh profilya dubletnikh Kα liniu pri rentgenostrukturom analyze polykristallov

G. V. Davydov, N. A. Erokhov and V. M. Erofeev

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A theory of sublattices and superlattices

R. Bucksch

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A cryogenic attachment for single crystal X-ray studies

J. O. Thomas

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Development of primary recrystallization textures in metastable austenitic steels

M. J. Dickson and R. P. Stratton

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Glassy carbon as standard for the normalization of small-angle scattering intensities

R. Perret and W. Ruland

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Interstratified layer structure of the organo-montmorillonites as revealed by electron microscopy

T. Yoshida and E. Suito

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A correlation of the short range order in Ni₃Fe with certain physical properties of this alloy

W. L. Wilson and R. W. Gould

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Crystallite sizes and surface areas of catalysts

W. L. Smith

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short communications

A possible error in a measurement of critical voltage in a high voltage electron microscope

D. G. Martin

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Influence of precipitation hardening and reversible martensite reactions on recrystallization textures of 17%Ni–8%Co–4%Mo steel

M. J. Dickson and S. D. Gray

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A method of producing optical diffraction masks representing static disorder in crystals using computer-generated patterns

T. R. Welberry, C. A. Taylor and H. J. Milledge

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On the convergence of the van Cittert method of deconvolution. Erratum

W. Ruland

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Computer-generated stereographic projections

R. A. Ploc and P. C. Barnett

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Compressibilities of some layer dichalcogenides

H. D. Flack

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The variance as a criterion for defocusing in powder diffractometry

A. K. Singh and C. Balasingh

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crystal data

Crystal data on thyroxine and thyroxine derivatives

V. Cody, M. Greiner and E. DeJarnette

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Neubestimmung der Elementarzelle von α-Natriummetavanadat

E. Erdoes

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Crystal data on Gd₃Ga₂

R. M. Gupta, M. L. Shepard, H. Hacker Jnr and H. H. Stadelmaier

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laboratory notes

Mechanically refrigerated gas streams for studies to -70°C

R. Rudman

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letters to the editor

Letter to the Editor

S. C. Abrahams

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notes and news

Notes and News

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crystallographers

Crystallographers

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international union of crystallography

Prices of publications of the Union

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book reviews

Interpretation of X-ray powder diffraction patterns by H. Lipson and H. Steeple

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Physics of p-n* junctions and semiconductor devices* edited by S. M. Ryvkin and Yu. V. Shmartsev

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Structural characteristics of materials edited by H. M. Finniston

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The physics of opto-electronic material edited by Albers Jr W. A. Albers Jr W. A.

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international union of crystallography

Second Supplement to the Crystallographic Book List

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