Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 6
|
Part 3
ISSN: 1600-5767
June 1973 issue
lead articles
J. Appl. Cryst.
(1973).
6
,
165-190
doi: 10.1107/S0021889873008459
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The direct observation of the structure of real crystals by lattice imaging
J. G. Allpress
and
J. V. Sanders
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research papers
J. Appl. Cryst.
(1973).
6
,
190-196
doi: 10.1107/S0021889873008460
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The accuracy of cell dimensions determined by Cohen's method of least squares and the systematic indexing of powder data
J. I. Langford
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J. Appl. Cryst.
(1973).
6
,
197-202
doi: 10.1107/S0021889873008472
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Geometrical and statistical aspects of the accuracy of camera powder data
J. I. Langford
and
A. J. C. Wilson
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J. Appl. Cryst.
(1973).
6
,
203-205
doi: 10.1107/S0021889873008484
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Effect of non-linearity error in the Warren–Averbach analysis
G. Gilli
and
P. A. Borea
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J. Appl. Cryst.
(1973).
6
,
206-216
doi: 10.1107/S0021889873008496
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Structural transitions at low temperatures in vanadium deuterides
D. G. Westlake
,
M. H. Mueller
and
H. W. Knott
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J. Appl. Cryst.
(1973).
6
,
217-224
doi: 10.1107/S0021889873008502
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An X-ray study of β-tantalum
R. D. Burbank
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J. Appl. Cryst.
(1973).
6
,
225-230
doi: 10.1107/S0021889873008514
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A new approach to the determination of crystallinity of polymers by X-ray diffraction
F. H. Chung
and
R. W. Scott
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J. Appl. Cryst.
(1973).
6
,
230-237
doi: 10.1107/S0021889873008526
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Note on the aberrations of a fixed-angle energy-dispersive powder diffractometer
A. J. C. Wilson
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J. Appl. Cryst.
(1973).
6
,
237-239
doi: 10.1107/S0021889873008538
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Determinations of particle size and strain in hexagonal (β-phase) silver–antimony alloys by the method of variance
M. De
and
S. P. Sen Gupta
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J. Appl. Cryst.
(1973).
6
,
240-243
doi: 10.1107/S002188987300854X
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Neutron diffraction, magnetic and superconducting measurements on vanadium–manganese–gallium alloys
W. J. Kitchingman
and
P. L. Norman
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short communications
J. Appl. Cryst.
(1973).
6
,
244
doi: 10.1107/S0021889873008551
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Absorption corrections: procedures for checking crystal shape, crystal orientation, and computer absorption programs: erratum
D. Cahen
and
J. A. Ibers
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J. Appl. Cryst.
(1973).
6
,
245
doi: 10.1107/S0021889873008563
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Zur methode der quantitativen röntgenographischen Phasenanalyse von Pulvergemischen
M. Trömel
and
G. Murken
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computer programs
J. Appl. Cryst.
(1973).
6
,
246-249
doi: 10.1107/S0021889873008575
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A general Fourier program for X-ray crystal-structure analysis which utilizes the Cooley–Tukey algorithm
A. Immirzi
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crystal data
J. Appl. Cryst.
(1973).
6
,
249-250
doi: 10.1107/S0021889873008587
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Powder diffraction data for U
3
O
5
P
2
O
7
J. M. Schaekers
and
W. G. Greybe
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laboratory notes
J. Appl. Cryst.
(1973).
6
,
250-251
doi: 10.1107/S0021889873008599
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A simple topographic camera
R. S. D'Amato
and
B. Greenberg
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crystallographers
J. Appl. Cryst.
(1973).
6
,
251
doi: 10.1107/S0021889873008605
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Crystallographers
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book reviews
J. Appl. Cryst.
(1973).
6
,
251-252
doi: 10.1107/S0021889873008617
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Microscopic identification of crystals
by R. E. Stoiber and S. A. Morse
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J. Appl. Cryst.
(1973).
6
,
252
doi: 10.1107/S0021889873008629
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Early papers on diffraction of X-rays by crystals. Vol. II
edited by J. M. Bijvoet, W. G. Burgers and G. Hägg
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J. Appl. Cryst.
(1973).
6
,
252-253
doi: 10.1107/S0021889873008630
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Electron microscopy in material science
edited by U. Valdré
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books received
J. Appl. Cryst.
(1973).
6
,
253
doi: 10.1107/S0021889873008642
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Handbook of Geochemistry. Vol. II/3
edited by K. H. Wedepohl
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meeting reports
J. Appl. Cryst.
(1973).
6
,
253-256
doi: 10.1107/S002188987300943X
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Conference on Phase Analysis: Identification and Quantitative Determination. Hull, 5–7 April 1972
J. H. C. Hogg
and
H. H. Sutherland
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