Journal of Applied Crystallography
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Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 6
|
Part 4
ISSN: 1600-5767
August 1973 issue
research papers
J. Appl. Cryst.
(1973).
6
,
257-266
doi: 10.1107/S0021889873008654
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Perfect crystals and imperfect neutrons
C. G. Shull
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J. Appl. Cryst.
(1973).
6
,
266-273
doi: 10.1107/S0021889873008666
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Automatic peak determination in X-ray powder patterns
D. Taupin
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J. Appl. Cryst.
(1973).
6
,
273-279
doi: 10.1107/S0021889873008678
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Long-period ordered structures in the quasi-binary Co
3
V–Ni
3
V alloy
T. Onozuka
,
S. Yamaguchi
and
M. Hirabayashi
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J. Appl. Cryst.
(1973).
6
,
280-284
doi: 10.1107/S002188987300868X
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Mesures rapides des intensités de diffraction sur monocristaux
G. C. Bassi
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J. Appl. Cryst.
(1973).
6
,
284-289
doi: 10.1107/S0021889873008691
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Structuration
A. L. Mackay
and
J. L. Finney
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J. Appl. Cryst.
(1973).
6
,
289-291
doi: 10.1107/S0021889873008708
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A specimen cell for studying oriented liquid crystals in X-ray diffraction and by polarized light
M. V. King
and
M. Young
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short communications
J. Appl. Cryst.
(1973).
6
,
292-293
doi: 10.1107/S002188987300871X
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On the inapplicability of the layer-transposition mechanism to polytype formation in ZnS
Z. H. Kalman
,
I. Kiflawi
and
I. T. Steinberger
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J. Appl. Cryst.
(1973).
6
,
293-295
doi: 10.1107/S0021889873008721
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The reference plane in determination of an orientation relation
S. W. Kennedy
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J. Appl. Cryst.
(1973).
6
,
295-297
doi: 10.1107/S0021889873008733
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A method to obtain good high-temperature X-ray patterns with a Guinier–Lenné camera
Ch. Susz
and
K. Yvon
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J. Appl. Cryst.
(1973).
6
,
297-298
doi: 10.1107/S0021889873008745
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Escape peaks caused by a Ge(Li) detector in an energy-dispersive diffractometer
T. Fukamachi
,
S. Togawa
and
S. Hosoya
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crystal data
J. Appl. Cryst.
(1973).
6
,
299-301
doi: 10.1107/S0021889873008757
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Données cristallographiques sur CuTh
2
(PO
4
)
3
et TlTh
2
(PO
4
)
3
M. Laügt
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J. Appl. Cryst.
(1973).
6
,
301-303
doi: 10.1107/S0021889873008769
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Lattice parameters and powder diffraction data for 14 RCo
2
Ge
2
compounds (R=La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y)
W. M. McCall
,
K. S. V. L. Narasimhan
and
R. A. Butera
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J. Appl. Cryst.
(1973).
6
,
303-304
doi: 10.1107/S0021889873008770
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Crystal data on phenylhydroxycyclopropenone
J. S. Chickos
,
A. F. Berndt
and
A. C. Claus
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computer programs
J. Appl. Cryst.
(1973).
6
,
304-305
doi: 10.1107/S0021889873008782
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A computer program for the identification of crystalline precipitates by means of selected-area electron diffraction
R. Bucksch
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J. Appl. Cryst.
(1973).
6
,
306
doi: 10.1107/S0021889873008794
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Note on a graphic display version of program
ORTEP
A. G. Nord
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crystallographers
J. Appl. Cryst.
(1973).
6
,
306
doi: 10.1107/S0021889873008800
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Crystallographers
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book reviews
J. Appl. Cryst.
(1973).
6
,
306-307
doi: 10.1107/S0021889873008812
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The crystal chemistry and physics of metals and alloys
by W. B. Pearson
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J. Appl. Cryst.
(1973).
6
,
307-308
doi: 10.1107/S0021889873008824
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Crystallisation. 2nd edition
by J. W. Mullin
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J. Appl. Cryst.
(1973).
6
,
308
doi: 10.1107/S0021889873008836
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Seeing beyond the visible
by A. Hewish
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books received
J. Appl. Cryst.
(1973).
6
,
308
doi: 10.1107/S0021889873008848
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Index of crystallographic supplies
edited by R. Rudman
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international union of crystallography
J. Appl. Cryst.
(1973).
6
,
309-346
doi: 10.1107/S002188987300885X
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World List of Computer Programs (Third Edition)
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