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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 7
|
Part 6
ISSN: 1600-5767
December 1974 issue
research papers
J. Appl. Cryst.
(1974).
7
,
515-518
doi: 10.1107/S0021889874010363
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Growth of unusual silicon carbide polytypes by island formation
U. Ram
,
M. Dubey
and
G. Singh
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J. Appl. Cryst.
(1974).
7
,
519-525
doi: 10.1107/S0021889874010375
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Quantitative interpretation of X-ray diffraction patterns of mixtures. I. Matrix-flushing method for quantitative multicomponent analysis
F. H. Chung
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J. Appl. Cryst.
(1974).
7
,
526-531
doi: 10.1107/S0021889874010387
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Quantitative interpretation of X-ray diffraction patterns of mixtures. II. Adiabatic principle of X-ray diffraction analysis of mixtures
F. H. Chung
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J. Appl. Cryst.
(1974).
7
,
531-535
doi: 10.1107/S0021889874010399
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Effective elimination of the Compton component in amorphous scattering by experimental means
M. Shimazu
and
A. Watanabe
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J. Appl. Cryst.
(1974).
7
,
535-540
doi: 10.1107/S0021889874010405
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An immobile dislocation arrangement in as-grown copper single crystals observed by X-ray topography
M. Kuriyama
,
J. G. Early
and
H. E. Burdette
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J. Appl. Cryst.
(1974).
7
,
541-546
doi: 10.1107/S0021889874010417
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A γ-ray diffractometer: a tool for investigating mosaic structure
J. R. Schneider
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J. Appl. Cryst.
(1974).
7
,
547-554
doi: 10.1107/S0021889874010429
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Interpretation of rocking curves measured by γ-ray diffractometry
J. R. Schneider
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J. Appl. Cryst.
(1974).
7
,
555-564
doi: 10.1107/S0021889874010430
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Intensity determination by profile-fitting applied to precession photographs
G. C. Ford
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J. Appl. Cryst.
(1974).
7
,
564-572
doi: 10.1107/S0021889874010442
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Intensitätsmessung bei ruhender Probe am Neutronen-Einkristalldiffraktometer
G. Egert
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J. Appl. Cryst.
(1974).
7
,
572-576
doi: 10.1107/S0021889874010454
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Mise en oeuvre d'une chambre haute température pour diffractomètre à rayons X. Application à l'étude précise de l'expansion thermique de LiNbO
3
entre l'ambiante et 1100°C
F. C. Lissalde
and
J. C. Peuzin
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J. Appl. Cryst.
(1974).
7
,
577-585
doi: 10.1107/S0021889874010466
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Optical-diffraction methods of studying the electron-diffraction patterns of thin films of copper–gold alloys
H. Lipson
and
W. S. Michael
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J. Appl. Cryst.
(1974).
7
,
585-587
doi: 10.1107/S0021889874010478
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Standard deviations of lattice parameters obtained from powder data measurements
J. Warczewski
and
P. M. de Wolff
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J. Appl. Cryst.
(1974).
7
,
588-592
doi: 10.1107/S002188987401048X
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Diffraction of neutrons by a vibrating quartz bar in the Laue case
R. Michalec
,
B. Chalupa
,
L. Sedláková
,
P. Mikula
,
V. Petržílka
and
J. Zelenka
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J. Appl. Cryst.
(1974).
7
,
593-598
doi: 10.1107/S0021889874010491
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The skew-symmetric two-crystal X-ray interferometer
P. Becker
and
U. Bonse
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J. Appl. Cryst.
(1974).
7
,
599-603
doi: 10.1107/S0021889874010508
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An automated drum scanner for rapid collection of X-ray crystallographic data
J. R. Einstein
and
B. W. McClelland
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J. Appl. Cryst.
(1974).
7
,
603-608
doi: 10.1107/S002188987401051X
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A computer-controlled X-ray powder diffractometer
P. J. King
and
W. L. Smith
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J. Appl. Cryst.
(1974).
7
,
608-610
doi: 10.1107/S0021889874010521
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Issledovanye tonkoy strukturi inkelya, deformirovannogo udarnimi volnami
E. F. Smyslov
,
G. V. Davydov
,
L. Z. Dankus
and
E. P. Alebastrova
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J. Appl. Cryst.
(1974).
7
,
611-615
doi: 10.1107/S0021889874010533
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Pressure-induced change in the long-period stacking sequence of the close-packed layers in Mg
3
In
H. Iwasaki
,
Y. Watanabe
and
S. Ogawa
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J. Appl. Cryst.
(1974).
7
,
615-617
doi: 10.1107/S0021889874010545
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A new type of electro-optic effect in semiconducting WO
3
E. Salje
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J. Appl. Cryst.
(1974).
7
,
618-620
doi: 10.1107/S0021889874010557
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A method for rapid crystal-surface characterization
T. Jokić
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J. Appl. Cryst.
(1974).
7
,
621-624
doi: 10.1107/S0021889874010569
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Indexing rhombohedral powder diffraction patterns
L. K. Frevel
and
T. P. Blumer
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J. Appl. Cryst.
(1974).
7
,
625-627
doi: 10.1107/S0021889874010570
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Optimization of the calculation of structure factors for large molecules
R. M. Burnett
and
C. E. Nordman
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J. Appl. Cryst.
(1974).
7
,
628-630
doi: 10.1107/S0021889874010582
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The lattice parameters of quenched gold–manganese solid-solution alloys
D. P. Morris
,
J. L. Hughes
and
R. P. Williams
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short communications
J. Appl. Cryst.
(1974).
7
,
631-632
doi: 10.1107/S0021889874010594
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Precise lattice constants and thermal expansion of K
2
Pt(CN)
4
Br
0.3
.3H
2
O
A. Freund
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crystal data
J. Appl. Cryst.
(1974).
7
,
632
doi: 10.1107/S0021889874010600
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Crystal data for cupric penicillamine disulphide hydrates. Errata
R. J. Gale
,
G. Donnay
and
C. A. Winkler
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computer programs
J. Appl. Cryst.
(1974).
7
,
632-633
doi: 10.1107/S0021889874010612
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A Fortran program for powder structure resolution
D. Minichelli
and
V. Longo
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laboratory notes
J. Appl. Cryst.
(1974).
7
,
634
doi: 10.1107/S0021889874010636
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Readily built instructional models
C. H. L. Kennard
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J. Appl. Cryst.
(1974).
7
,
634-635
doi: 10.1107/S0021889874010624
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High-temperature cell for a small-angle X-ray goniometer
A. F. Craievich
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letters to the editor
J. Appl. Cryst.
(1974).
7
,
635-636
doi: 10.1107/S0021889874010648
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On the imaging of composition modulations
D. E. Laughlin
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crystallographers
J. Appl. Cryst.
(1974).
7
,
636
doi: 10.1107/S002188987401065X
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1974).
7
,
636
doi: 10.1107/S0021889874010673
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Acta Crystallographica
and
Journals of Applied Crystallography
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notes and news
J. Appl. Cryst.
(1974).
7
,
636-637
doi: 10.1107/S0021889874010661
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book reviews
J. Appl. Cryst.
(1974).
7
,
637
doi: 10.1107/S0021889874010685
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Standard X-ray diffraction powder patterns. Section 11
by H. E. Swanson, H. F. McMurdie, M. C. Morris, E. H. Evans and B. Paretzkin
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J. Appl. Cryst.
(1974).
7
,
637-638
doi: 10.1107/S0021889874010697
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The growth of crystals from liquids
by J. C. Brice
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J. Appl. Cryst.
(1974).
7
,
638
doi: 10.1107/S0021889874010703
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Crystal growth - an introduction
edited by W. Bardsley, D. T. J. Hurle and J. B. Mullin
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