Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 8| Part 1

ISSN: 1600-5767

February 1975 issue

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research papers

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Automatic collection of powder data from photographs

E. J. Sonneveld and J. W. Visser

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The effects of instrumental distortion in X-ray diffraction studies of liquids. I. A study of the relative effectiveness of several monochromatizing techniques

S. C. Smelser, E. H. Henninger, C. J. Pings and G. D. Wignall

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Thickness measurements of wet protein crystals in the electron microscope

D. L. Dorset and D. F. Parsons

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Studies of the size and the misorientation of the mosaic blocks in pure and doped single crystals of potassium chloride

G. B. Mitra and B. K. Samantaray

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Quantitative interpretation of X-ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities

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The neutron Fourier chopper in protein crystallography

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Misorientation contrast of crystal subgrain boundaries in Berg–Barrett X-ray micrographs

C. Cm. Wu and R. W. Armstrong

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The avoidance of multiple diffraction errors in single-crystal intensity measurements at low temperatures

R. Hine, J. P. G. Richards and K. Tichy

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Measurement of strain and lattice parameter in epitaxic layers

M. Hart and K. H. Lloyd

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A silicon powder diffraction standard reference material

C. R. Hubbard, H. E. Swanson and F. A. Mauer

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Electron-induced decomposition of Tin(IV) sulphide in the electron microscope

G. J. Tatlock and M. White

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PERNOD - Ein Programm zur Verfeinerung von Kristallstrukturparametern aus Neutronenbeugungspulverdiagrammen

S. Klein and H. Weitzel

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The measurement of integrated intensities from polymeric-fibre X-ray diffraction photographs

I. H. Hall and M. G. Pass

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short communications

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Lattice parameter of the non-stoichiometric compound TiN_x

S. Nagakura, T. Kusunoki, F. Kakimoto and Y. Hirotsu

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The variances of the Cu Kβ and Fe Kβ spectral distributions

J. I. Langford and J. Tapia

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Computer simulation of X-ray topographs of stacking faults in silicon

B. C. Wonsiewicz and J. R. Patel

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crystal data

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Crystal data for C.I. pigment Red 6, 4-chloro-2-nitrophenylazo-2-naphthol

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Crystal data for Mn₅Si₂

J. P. Sénateur, R. Fruchart and C. B. Shoemaker

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computer programs

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A general computer program for the analysis of X-ray diffraction data for liquids

G. Licheri, G. Piccaluga and G. Pinna

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laboratory notes

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A miniature goniometer head

M. Atoji and E. F. Bielick

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crystallographers

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Crystallographers

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international union of crystallography

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Tenth General Assembly and International Congress of Crystallography

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notes and news

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Notes and News

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book reviews

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Diffusion and defect data edited by F. H. Wöhlbier

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An Introduction to X-ray spectrometry by R. Jenkins

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Applied mineralogy. Vol. 5. Apatite by D. McConnell

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Dislocations and plastic deformation by I. Kovács and L. Zsoldos

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books received

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Mechanische anisotropie edited by H. P. Stüwe

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