Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 8| Part 6

ISSN: 1600-5767

December 1975 issue

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research papers

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A low-temperature X-ray study of the rhombohedral deformation of nickel oxide containing magnesium

G. Bliznakov, I. Tsolovski and D. Mehandjiev

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Determination of structure factors by white X-ray diffraction from a powder sample of GaP

R. Uno and J. Ishigaki

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Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. I. Modèle d'empilement ne comportant que des fautes de translation

A. Plançon and C. Tchoubar

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Programme Fortran pour l'analyse tridimensionnelle des textures sans hypothèse restrictive sur les symétries de l'échantillon

A. Clément and G. Durand

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Periodic antiphase domain structure in the off-stoichiometric CuAu II phase

D. Watanabe and K. Takashima

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Formation des polytypes rhomboédriques de sulfure de titane

J.-J. Legendre, R. Moret, E. Tronc and M. Huber

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An improved α₂ elimination

R. Delhez and E. J. Mittemeijer

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An analysis of errors in the Fourier coefficients of the α₁ line profile

R. Delhez and E. J. Mittemeijer

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The asymmetry of neutron powder diffraction peaks

M. J. Cooper and J. P. Sayer

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The estimated standard deviation of a step-scan-measured Bragg reflexion intensity

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Effects of electrostatic field on the diffraction contrast of imperfections in quartz

S. Yamashita and N. Kato

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Textures of cold-rolled pure aluminum measured by neutron and X-ray diffraction

O. J. Eder and R. Klemencic

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The effect of non-linearity on a two-dimensional model of crystal-growth disorder

T. R. Welberry and R. Galbraith

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On the dielectric behaviour of cadmium iodide polytypes

A. M. Fernandez and O. N. Srivastava

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USCI - Ein Programm zur Indizierung von Einkristallreflexen

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Analyse des bandes de diffraction affectées par une fonction défaut instrumentale

J. de Courville and D. Tchoubar

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On the widths of dislocation images in X-ray topography under low-absorption conditions

J. E. A. Miltat and D. K. Bowen

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Ein neues Verfahren zur gleichzeitigen Photographie zweier Netzebenen des reziproken Gitters

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The termination effect for amorphous patterns

B. E. Warren and R. L. Mozzi

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Measurement of Weissenberg films with a computer-controlled drum microdensitometer

L. Sjölin, G. Olsson and O. Lindqvist

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short communications

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Automated computer indexing of powder patterns: the monoclinic case

G. S. Smith and E. Kahara

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Rapid determination of polarity sense by an energy-dispersive diffractometer: erratum

S. Hosoya and T. Fukamachi

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Réalisation d'un cryostat à température réglable pour diffractométrie X sur monocristal

G. Odou and M. More

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crystal data

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Crystal data for the tetraphenylarsonium salt of the monoanion of theophylline, [(C₆H₅)₄As] [C₇N₄O₂H₇].5H₂O

T. J. Kistenmacher and H. B. Kerfoot

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Crystal data for two polymorphic forms of PuOs₂

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Etude diffractométrique de chlorures doubles du type β-K₂SO₄

J. Lamotte and M. Vermeire

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An X-ray study of silver amalgam and its stoichiometry

K. A. Nirmala and D. S. S. Gowda

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Crystal data for two anhydrous compounds of methanesulphonic acid: Ca(CH₃SO₃)₂ and Ag(CH₃SO₃)

F. Charbonnier, R. Faure and H. Loiseleur

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laboratory notes

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Two simple devices for sealing wet single crystals in capillary tubes

F. D'Aprile and R. Moretto

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crystallographers

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Crystallographers

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international union of crystallography

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Acta Crystallographica and Journals of Applied Crystallography

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notes and news

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Notes and News

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book reviews

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Liquid phase epitaxy by G. M. Blom, S. L. Blank and J. M. Woodall

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Metallphysik by G. E. R. Schulze

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