Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 9
|
Part 2
ISSN: 1600-5767
April 1976 issue
research papers
J. Appl. Cryst.
(1976).
9
,
63-67
doi: 10.1107/S0021889876010650
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Intensity correction factors for neutron powder diffraction measurements
M. J. Cooper
and
A. V. Glasspool
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J. Appl. Cryst.
(1976).
9
,
68-80
doi: 10.1107/S0021889876010662
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Spherical-wave theory of the zero-absorption LLL X-ray or neutron interferometer
W. Bauspiess
,
U. Bonse
and
W. Graeff
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J. Appl. Cryst.
(1976).
9
,
81-94
doi: 10.1107/S0021889876010674
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Digital processing of fibre diffraction patterns
R. D. B. Fraser
,
T. P. Macrae
,
A. Miller
and
R. J. Rowlands
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J. Appl. Cryst.
(1976).
9
,
95-97
doi: 10.1107/S0021889876010686
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A snare affecting the recording of disorder diffuse reflections of `spike' type
S. Suzuki
and
A. R. Lang
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J. Appl. Cryst.
(1976).
9
,
98-105
doi: 10.1107/S0021889876010698
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Stabilities and cell parameters for phases of the AgI–NH
4
I–H
2
O system
L. R. Johnson
and
B. L. Davis
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J. Appl. Cryst.
(1976).
9
,
106-114
doi: 10.1107/S0021889876010704
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A method of increasing the detected intensity in X-ray powder diffractometers
R. Narayan
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J. Appl. Cryst.
(1976).
9
,
115-118
doi: 10.1107/S0021889876010716
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A single-crystal automatic indexing procedure
R. A. Jacobson
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J. Appl. Cryst.
(1976).
9
,
119-125
doi: 10.1107/S0021889876010728
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A four-circle single crystal diffractometer with a rotating anode source
W. R. Massey Jnr
and
P. C. Manor
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J. Appl. Cryst.
(1976).
9
,
126-129
doi: 10.1107/S002188987601073X
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Influence de la variation du facteur de structure avec l'écart à la position de Bragg, sur l'analyse des profils de raie
F. Bley
and
M. Fayard
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J. Appl. Cryst.
(1976).
9
,
130-133
doi: 10.1107/S0021889876010741
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Neutron Weissenberg photographs of satellite reflexions in plagioclase feldspars
D. Hohlwein
and
W. Joswig
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J. Appl. Cryst.
(1976).
9
,
134-138
doi: 10.1107/S0021889876010753
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X-ray scattering and radial distribution function of liquid water
F. Hajdu
,
S. Lengyel
and
G. Pálinkás
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J. Appl. Cryst.
(1976).
9
,
139-141
doi: 10.1107/S0021889876010765
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An estimate of crystallite size from the peak of the diffraction line-profile
W. L. Smith
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J. Appl. Cryst.
(1976).
9
,
142-144
doi: 10.1107/S0021889876010777
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A facile location of goniometer tilt-axis position with respect to a single-crystal electron-diffraction pattern orientation
D. L. Dorset
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J. Appl. Cryst.
(1976).
9
,
145-158
doi: 10.1107/S0021889876010789
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A second harmonic analyzer for the detection of non-centrosymmetry
J. P. Dougherty
and
S. K. Kurtz
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J. Appl. Cryst.
(1976).
9
,
159-168
doi: 10.1107/S0021889876010790
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A comparison between the structures of amorphous and liquid Ag–Cu and Cu–Mg alloys
W. E. Lukens
and
C. N. J. Wagner
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J. Appl. Cryst.
(1976).
9
,
169-174
doi: 10.1107/S0021889876010807
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The reference intensity ratio,
I
/
I
c
, for computer simulated powder patterns
C. R. Hubbard
,
E. H. Evans
and
D. K. Smith
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J. Appl. Cryst.
(1976).
9
,
175-177
doi: 10.1107/S0021889876010819
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Caractérisation du fer amorphe élaboré par décomposition à froid du fer carbonyle
J. P. Lauriat
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short communications
J. Appl. Cryst.
(1976).
9
,
178-180
doi: 10.1107/S0021889876010820
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Topographic observation of micro defects (
e.g.
`swirls') in nearly perfect crystals
M. Renninger
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J. Appl. Cryst.
(1976).
9
,
180-181
doi: 10.1107/S0021889876010832
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Méthode de détermination rapide par diffraction électronique des faces de croissance de l'hématite
F. Tissier
,
J. Bessières
and
R. Baro
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J. Appl. Cryst.
(1976).
9
,
181-182
doi: 10.1107/S0021889876010844
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Extension of the
FIGATOM
program to the automatic plotting of layers in close-packed structures: erratum
G. A. Langlet
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crystal data
J. Appl. Cryst.
(1976).
9
,
183
doi: 10.1107/S0021889876010856
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Crystal data of three new potassium hydrogen polyiodate compounds
S. A. Hamid
and
G. Kunze
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J. Appl. Cryst.
(1976).
9
,
184
doi: 10.1107/S0021889876010868
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Données cristallographiques sur le trimétaphosphate de plomb trihydraté Pb
3
(P
3
O
9
)
2
.3H
2
O
A. Durif
and
M. Brunel-Laügt
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laboratory notes
J. Appl. Cryst.
(1976).
9
,
185
doi: 10.1107/S002188987601087X
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Manipulator for Gandolfi-attachment X-ray spindles
G. H. Myer
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J. Appl. Cryst.
(1976).
9
,
185
doi: 10.1107/S0021889876010881
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A stereographic net for measuring direction cosines
P. T. Clarke
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crystallographers
J. Appl. Cryst.
(1976).
9
,
185
doi: 10.1107/S0021889876010893
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1976).
9
,
186
doi: 10.1107/S002188987601090X
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Commission on Crystallographic Apparatus
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J. Appl. Cryst.
(1976).
9
,
186
doi: 10.1107/S0021889876012260
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Anomalous Scattering
Errata
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book reviews
J. Appl. Cryst.
(1976).
9
,
186
doi: 10.1107/S0021889876010911
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The physics of liquid crystals
by P. D. de Gennes
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