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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 12
|
Part 1
ISSN: 1600-5767
February 1979 issue
research papers
J. Appl. Cryst.
(1979).
12
,
1-9
doi: 10.1107/S0021889879011663
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X-ray television area detectors for macromolecular structural studies with synchrotron radiation sources
U. W. Arndt
and
D. J. Gilmore
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J. Appl. Cryst.
(1979).
12
,
10-14
doi: 10.1107/S0021889879011675
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Diffractometry of closely superimposed twins and clusters: a method and a program for establishing UB matrices of single-crystal individuals
K. Tichý
and
J. Beneš
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J. Appl. Cryst.
(1979).
12
,
15-18
doi: 10.1107/S0021889879011687
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Correction de temps mort des raies de diffraction X
J. Rigoult
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J. Appl. Cryst.
(1979).
12
,
19-24
doi: 10.1107/S0021889879011699
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On the possibility of utilizing holographic schemes in X-ray microscopy
V. V. Aristov
and
G. A. Ivanova
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J. Appl. Cryst.
(1979).
12
,
25-26
doi: 10.1107/S0021889879011705
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X-ray beam polarization measurements
Y. Le Page
,
E. J. Gabe
and
L. D. Calvert
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J. Appl. Cryst.
(1979).
12
,
27-33
doi: 10.1107/S0021889879011717
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Microfibril dimensions from small-angle X-ray scattering
B. Crist Jnr
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J. Appl. Cryst.
(1979).
12
,
34-38
doi: 10.1107/S0021889879011729
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X-ray diffraction study of MgCl
2
aqueous solutions
R. Caminiti
,
G. Licheri
,
G. Piccaluga
and
G. Pinna
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J. Appl. Cryst.
(1979).
12
,
39-41
doi: 10.1107/S0021889879011730
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Dépouillement par ordinateur des clichés de diffraction obtenus par la méthode de Laue
J.-P. Riquet
and
R. Bonnet
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J. Appl. Cryst.
(1979).
12
,
42-48
doi: 10.1107/S0021889879011742
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Small-angle X-ray data processing for planar multilayered structures. I. Theory
C. R. Worthington
and
S. K. Wang
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J. Appl. Cryst.
(1979).
12
,
49-53
doi: 10.1107/S0021889879011754
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Lattice parameters and birefringence in PbTiO
3
single crystals
S. A. Mabud
and
A. M. Glazer
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J. Appl. Cryst.
(1979).
12
,
54-56
doi: 10.1107/S0021889879011766
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Pyroelectric temperature analysis as a method for study of ferroelectric transitions in polycrystalline materials
M. Topić
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J. Appl. Cryst.
(1979).
12
,
57-59
doi: 10.1107/S0021889879011778
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Five new polytypes and polytypic change in PbI
2
T. Minagawa
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J. Appl. Cryst.
(1979).
12
,
60-65
doi: 10.1107/S002188987901178X
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F
N
: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing
G. S. Smith
and
R. L. Snyder
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J. Appl. Cryst.
(1979).
12
,
66-69
doi: 10.1107/S0021889879011791
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Orientations mutuelles observées sur des cristaux d'hématite
J. Rozière
,
C. Baltzinger
and
R. Baro
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J. Appl. Cryst.
(1979).
12
,
70-77
doi: 10.1107/S0021889879011808
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Etude des défauts dans des monocristaux naturels de béryl. I. Observations des dislocations
E. Scandale
,
F. Scordari
and
A. Zarka
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J. Appl. Cryst.
(1979).
12
,
78-83
doi: 10.1107/S002188987901181X
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Etude des défauts dans des monocristaux naturels de béryl. II. Etude de croissance
E. Scandale
,
F. Scordari
and
A. Zarka
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J. Appl. Cryst.
(1979).
12
,
84-90
doi: 10.1107/S0021889879011821
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Etude précise des diagrammes de diffraction électronique de poudres de cristaux à grands paramètres. Exemple des phosphates de calcium. Intérêt de la diffraction à très haute tension. Calcul et tracé de diagrammes théoriques
J. Puech
,
M. Puech-Baux
,
G. Alcouffe
,
M. Brieu
and
L. Lafourcade
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J. Appl. Cryst.
(1979).
12
,
91-94
doi: 10.1107/S0021889879011833
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Constitutional defect structure of CuAl
2
H. Zogg
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J. Appl. Cryst.
(1979).
12
,
95-98
doi: 10.1107/S0021889879011845
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A real-time back-reflection Laue camera
D. H. Bilderback
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J. Appl. Cryst.
(1979).
12
,
99-103
doi: 10.1107/S0021889879011857
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The orientation of apatite crystals in bone
G. E. Bacon
,
P. J. Bacon
and
R. K. Griffiths
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J. Appl. Cryst.
(1979).
12
,
104-106
doi: 10.1107/S0021889879011869
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Piezoelectric and pyroelectric ionic displacements in Na(H
3
O)[I(OH)
3
O
3
]
S. C. Abrahams
,
F. Lissalde
and
J. L. Bernstein
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J. Appl. Cryst.
(1979).
12
,
107-109
doi: 10.1107/S0021889879011870
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Quantitative analysis of multicomponent powders by full-profile refinement of Guinier–Hägg X-ray film data
P.-E. Werner
,
S. Salomé
,
G. Malmros
and
J. O. Thomas
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J. Appl. Cryst.
(1979).
12
,
110-115
doi: 10.1107/S0021889879011882
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Determination of the Burgers vector of perfect dislocations observed by X-ray topography in hexagonal single crystals
C. G'Sell
and
Y. Epelboin
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J. Appl. Cryst.
(1979).
12
,
116-118
doi: 10.1107/S0021889879011894
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Détermination de l'intensité intégrée en step-scanning
J. Rigoult
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J. Appl. Cryst.
(1979).
12
,
119-125
doi: 10.1107/S0021889879011900
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Diffraction line broadening of crystals containing small-angle boundaries
M. Wilkens
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short communications
J. Appl. Cryst.
(1979).
12
,
126
doi: 10.1107/S0021889879011912
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Gandolfi attachment for a Debye–Scherrer camera
G. Moss
,
D. F. Wentworth
and
Z. Barnea
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J. Appl. Cryst.
(1979).
12
,
127-128
doi: 10.1107/S0021889879011924
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An X-ray goniometer for producing accurately oriented crystal faces
K. H. Lloyd
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J. Appl. Cryst.
(1979).
12
,
129
doi: 10.1107/S0021889879011936
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Harmonic-free single-crystal monochromators for neutrons and X-rays
M. Hart
and
A. R. D. Rodrigues
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crystal data
J. Appl. Cryst.
(1979).
12
,
129-130
doi: 10.1107/S0021889879011948
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New crystal data for silver sulphide sulphate, Ag
8
S
3
SO
4
H. Hirsch
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J. Appl. Cryst.
(1979).
12
,
131-132
doi: 10.1107/S002188987901195X
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Crystal data for calcium fluoride silicon oxide (CaF
2
.SiO
2
), a dehydration product of fluorapophyllite
G. F. Marriner
,
J. I. Langford
and
J. Tarney
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computer programs
J. Appl. Cryst.
(1979).
12
,
133-134
doi: 10.1107/S0021889879011961
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Computer-generated standard stereographic projections
M. E. Packer
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J. Appl. Cryst.
(1979).
12
,
134
doi: 10.1107/S0021889879011973
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Profile analysis of diffractometer data
O. Lindqvist
and
E. Ljungström
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laboratory notes
J. Appl. Cryst.
(1979).
12
,
135
doi: 10.1107/S0021889879011997
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A semiautomatic coordinate measuring device for molecular models
Y. Mitsui
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J. Appl. Cryst.
(1979).
12
,
135-136
doi: 10.1107/S0021889879011985
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Model drawing programs: manufacture of masks to produce optical transforms
C. H. L. Kennard
and
K. G. Shields
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J. Appl. Cryst.
(1979).
12
,
136
doi: 10.1107/S0021889879012000
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A status monitor for the Elliott rotating-anode X-ray source
W. R. Massey Jnr
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J. Appl. Cryst.
(1979).
12
,
137
doi: 10.1107/S0021889879012012
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A low-cost Richards box for superimposing molecular models on three-dimensional electron density maps
C. H. L. Kennard
and
L. Bretherton
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meeting reports
J. Appl. Cryst.
(1979).
12
,
137-138
doi: 10.1107/S0021889879012024
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Synchrotron Radiation Symposium, European Physical Society Fourth General Conference, York, England, 25–29 September 1978
H. Stuhrmann
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J. Appl. Cryst.
(1979).
12
,
138
doi: 10.1107/S0021889879012036
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Teaching Crystallography for Today's Sciences, Summer School, Erice, Sicily, Italy, 6–16 September 1977
A. Authier
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crystallographers
J. Appl. Cryst.
(1979).
12
,
138
doi: 10.1107/S0021889879012048
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1979).
12
,
138
doi: 10.1107/S002188987901205X
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Union Office, Change of Address
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J. Appl. Cryst.
(1979).
12
,
138-139
doi: 10.1107/S0021889879012061
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Copying Fees and Copyright Law
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book reviews
J. Appl. Cryst.
(1979).
12
,
139-140
doi: 10.1107/S0021889879012073
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Crystallography
by M. P. Shaskol'skaya
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