Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 12| Part 2

ISSN: 1600-5767

April 1979 issue

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research papers

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Bragg-case diffraction curves from copper whiskers by the X-ray triple-crystal diffraction method

O. Nittono, H. Yamagishi and S. Nagakura

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AIDED, a program for the automatic indexing of epitaxic derivatives; application to the graphite lamellar compounds

A. Setton and R. Setton

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Détermination par extensométrie et mesures ultrasonores des six constantes elastiques du cristal Al₂Cu (π). Duscussion de l'anisotropie

N. Fribourg-Blanc, M. Dupeux, G. Guenin and R. Bonnet

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The resolution of the precession camera

M. Ogino and J. Harada

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Interprétation de Micromacles observées sur des faces (01.2) de l'hématite

C. Baltzinger, J. Rozière and R. Baro

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The interpretation of real-space information from small-angle scattering experiments

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Determination of intersubunit distances and subunit shape parameters in DNA-dependent RNA polymerase by neutron small-angle scattering

P. Stöckel, R. May, I. Strell, Z. Cejka, W. Hoppe, H. Heumann, W. Zillig, H. L. Crespi, J. J. Katz and K. Ibel

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A perfect-crystal neutron polarizer as an application of magnetic prism refraction

G. Badurek, H. Rauch, A. Wilfing, U. Bonse and W. Graeff

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The small-angle neutron scattering facility at the SAFARI-1 reactor

C. Hofmeyr, R. M. Mayer and D. L. Tillwick

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The use of nuclear emulsions in X-ray topography: improvement of the development methods

Y. Epelboin, A. Jeanne-Michaud and A. Zarka

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The doping method in quantitative X-ray diffraction phase analysis

S. Popović and B. Gržeta-Plenković

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Determination of strain distribution in elastically bent materials by X-ray intensity measurement

Z. H. Kalman and S. Weissmann

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A high-temperature focusing X-ray powder camera with new features

G. Hägg, N. O. Ersson, G. Rudenholm and B. Sellberg

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Processing oscillation diffraction data for very large unit cells with an automatic convolution technique and profile fitting

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short communications

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A solid-state transformation in 1,5-dichloroanthraquinone

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A reindexing of the X-ray powder diffraction pattern of β-LiAlO₂

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crystal data

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Crystal data for isotypic Cs₂[M(CN)₄].H₂O compounds, M=Pt, Pd and Ni

W. Holzapfel, H. H. Otto, H. Yersin and G. Gliemann

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X-ray powder diffraction data for strontium aluminate, SrAl₂O₄

F. Hanic, T. Y. Chemekova and J. Majling

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Crystal data for Na₃Mg₂P₅O₁₆

J. Majling and F. Hanic

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Studies on selenates. IV. Crystal chemical data for cobalt(II) selenate tetrahydrate

M. A. Nabar and S. V. Paralkar

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Crystal data for ammonium thiosulphate (NH₄)₂S₂O₃

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Etude cristallochimique du di-o-thymotide C₂₂H₂₄O₄

M. Marais, J. Burgeat, F. Heliot, J. Primot and J. Jerphagnon

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Powder data for some new europium antimonides and bismuthides

J. B. Taylor, L. D. Calvert and Y. Wang

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Crystal data and crystal growth of Pb₅GeO₇

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Crystal data for the chloride of tetrakis(imidazole) palladium(II), [Pd(ImH)₄]Cl₂ and the tetrachloropalladate of tetrakis(N-methylimidazole) palladium(II); [Pd(NMeIm)₄] [PdCl₄]

M. C. Navarro Ranninger

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Crystal data for cis- and trans-dichlorobis(N-methylimidazole)palladium(II)

M. C. Navarro Ranninger

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Crystal data for naphthaceno[5,6-cd]-1,2-dithiole–7,7,8,8-tetracyanoquinodimethane (DTT–TCNQ)

P. J. Nigrey and H. Katz

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Crystal data for the trimetaphosphates of lanthanum, cerium and praseodymium

I. L. Botto and E. J. Baran

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computer programs

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The matching of rigid bodies; a program using Kabsch's procedure

P. S. Yuen and S. C. Nyburg

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Tracé automatique des courbes d'égal facteur de Schmid

G. Alcouffe, B. Legros-de-Mauduit and A. Remon Sancho

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laboratory notes

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A comment on `a simple method for measuring crystal densities' (Zamvil, Pludow & Fucaloro, 1978)

R. G. Eggins and C. H. L. Kennard

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The use of ultrasonics for cleaning crystals

R. G. Eggins and C. H. L. Kennard

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international union of crystallography

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Eleventh International Congress of Crystallography. Communicated Abstracts: Supplement to Acta Crystallographica

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Dimensions of Material Deposited under the Supplementary Publication Scheme

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crystallographers

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Crystallographers

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book reviews

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Semi-metals & narrow-bandgap semiconductors by D. R. Lovett

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