Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 13
|
Part 5
ISSN: 1600-5767
October 1980 issue
research papers
J. Appl. Cryst.
(1980).
13
,
403-409
doi: 10.1107/S0021889880012459
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Phase transitions in ammonium nitrate
C. S. Choi
,
H. J. Prask
and
E. Prince
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J. Appl. Cryst.
(1980).
13
,
410-416
doi: 10.1107/S0021889880012460
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The measurement of the X-ray scattering factors of silicon from the fine structure of Laue-case rocking curves
U. Bonse
and
R. Teworte
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J. Appl. Cryst.
(1980).
13
,
417-424
doi: 10.1107/S0021889880012472
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Crystal subgrain misorientations observed by X-ray topography in reflection
R. W. Armstrong
,
W. J. Boettinger
and
M. Kuriyama
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J. Appl. Cryst.
(1980).
13
,
425-432
doi: 10.1107/S0021889880012484
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A novel low-temperature X-ray goniometer with closed-cycle cooling to about 18 K
S. Samson
,
E. Goldish
and
C. J. Dick
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J. Appl. Cryst.
(1980).
13
,
433-437
doi: 10.1107/S0021889880012496
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A white-X-ray four-circle diffractometer
T. Sakamaki
,
S. Hosoya
and
T. Fukamachi
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J. Appl. Cryst.
(1980).
13
,
438-449
doi: 10.1107/S0021889880012502
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Small-angle X-ray scattering due to sample shape
P. H. Stothart
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crystal data
J. Appl. Cryst.
(1980).
13
,
450-451
doi: 10.1107/S0021889880012514
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Preparation and X-ray powder diffraction studies of triple orthovanadates having langbeinite structure
M. A. Nabar
and
D. S. Phanasgaonkar
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J. Appl. Cryst.
(1980).
13
,
452-453
doi: 10.1107/S0021889880012526
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Données cristallographiques sur les thiocyanates de tris(éthylènediamine)rhodium(III) actif, racémique et racémique actif
C. Brouty
,
A. Whuler
and
P. Spinat
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J. Appl. Cryst.
(1980).
13
,
454-458
doi: 10.1107/S0021889880012538
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An X-ray diffraction study of the system Al
2
Se
3
In
2
Se
3
in the In-rich region
B. Gržeta-Plenković
,
S. Popović
,
D. Desnica
and
U. Desnica
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J. Appl. Cryst.
(1980).
13
,
458-459
doi: 10.1107/S002188988001254X
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Crystal data for a third polymorph (γ) of C.I. Pigment Red 1,1-[(4-nitrophenyl)azo]-2-naphthol
A. Whitaker
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computer programs
J. Appl. Cryst.
(1980).
13
,
459-461
doi: 10.1107/S0021889880012551
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Computer program for radial distribution calculation from known bonding topologies
P. D'Antonio
and
J. H. Konnert
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laboratory notes
J. Appl. Cryst.
(1980).
13
,
462
doi: 10.1107/S0021889880012563
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A technique for controlling preferred orientation in powder diffraction samples
L. D. Calvert
and
A. F. Sirianni
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crystallographers
J. Appl. Cryst.
(1980).
13
,
462
doi: 10.1107/S0021889880012575
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Crystallographers
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book reviews
J. Appl. Cryst.
(1980).
13
,
462-463
doi: 10.1107/S0021889880012587
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Advances in X-ray analysis. Vol.
22 edited by G. J. McCarthy, C. S. Barrett, D. E. Leyden, J. B. Newkirk and C. O. Ruud
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J. Appl. Cryst.
(1980).
13
,
463
doi: 10.1107/S0021889880012599
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Industrial crystallization 78
edited by E. J. De Jong and S. J. Jancic
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J. Appl. Cryst.
(1980).
13
,
463-464
doi: 10.1107/S0021889880012605
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Scanning electron microscopy/1979. Parts I and II
edited by O. Johari
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