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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 13
|
Part 6
ISSN: 1600-5767
December 1980 issue
research papers
J. Appl. Cryst.
(1980).
13
,
465-471
doi: 10.1107/S0021889880012617
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A systematic method of estimating the performance of X-ray optical systems for synchrotron radiation. I. Description of various optical elements in position–angle space for ideally monochromatic X-rays
T. Matsushita
and
U. Kaminaga
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J. Appl. Cryst.
(1980).
13
,
472-478
doi: 10.1107/S0021889880012629
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A systematic method of estimating the performance of X-ray optical systems for synchrotron radiation. II. Treatment in position-angle–wavelength space
T. Matsushita
and
U. Kaminaga
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J. Appl. Cryst.
(1980).
13
,
479-485
doi: 10.1107/S0021889880012630
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Optimization of quantitative X-ray diffraction analysis
P. Szabó
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J. Appl. Cryst.
(1980).
13
,
486-493
doi: 10.1107/S0021889880012642
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An X-ray crystallographic study of V
2
D
H. S. U. Jo
,
S. C. Moss
and
D. G. Westlake
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J. Appl. Cryst.
(1980).
13
,
494-499
doi: 10.1107/S0021889880012654
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Calcul de la FDOC à différents ordres de développement. Choix de l'ordre en fonction de l'acuité de la texture dans le cas de tôles d'aluminium
P. Dervin
,
M. Pernot
and
R. Penelle
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J. Appl. Cryst.
(1980).
13
,
500-504
doi: 10.1107/S0021889880012666
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A determination of the normalization factor and its application to the incomplete pole-figure method
M. Humbert
and
H. W. Bergmann
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J. Appl. Cryst.
(1980).
13
,
505-512
doi: 10.1107/S0021889880012678
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The structure of a lipid–water lamellar phase containing two types of lipid monolayers. An X-ray and neutron scattering study
J. L. Ranck
,
G. Zaccaï
and
V. Luzzati
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J. Appl. Cryst.
(1980).
13
,
513-515
doi: 10.1107/S002188988001268X
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Détermination précise de la composition de couches epitaxiées Ga
1−
x
In
x
P (0≤
x
≤0,10)
A. Etcheberry
,
A. Marbeuf
,
M. Rommeluere
and
J. Rioux
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J. Appl. Cryst.
(1980).
13
,
516-520
doi: 10.1107/S0021889880012691
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Absolute sense and model for the piezoelectric and pyroelectric coefficients in Ba(NO
2
)
2
H
2
O and Cs
2
S
2
O
6
R. Liminga
,
S. C. Abrahams
and
J. L. Bernstein
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J. Appl. Cryst.
(1980).
13
,
521-523
doi: 10.1107/S0021889880012708
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The limiting size of natural paracrystals
F. J. Baltá-Calleja
and
R. Hosemann
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J. Appl. Cryst.
(1980).
13
,
524-528
doi: 10.1107/S002188988001271X
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The calculation of intensities diffracted by a partially oriented powder with a layer structure
A. Plançon
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J. Appl. Cryst.
(1980).
13
,
529-532
doi: 10.1107/S0021889880012721
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A search for internal distortion in CeBi
M. H. Mueller
,
H. Shaked
and
O. Vogt
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J. Appl. Cryst.
(1980).
13
,
533-538
doi: 10.1107/S0021889880012733
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Theoretical investigation of the ferroelastic domain structure in cesium lead chloride in the monoclinic phase
M. Chabin
and
F. Gilletta
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J. Appl. Cryst.
(1980).
13
,
539-543
doi: 10.1107/S0021889880012745
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Experiment investigation of the ferroelastic domain structure in cesium lead chloride in the monoclinic phase
M. Chabin
and
F. Gilletta
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J. Appl. Cryst.
(1980).
13
,
544-554
doi: 10.1107/S0021889880012757
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The role of the inversion centre in texture analysis
H. J. Bunge
,
C. Esling
and
J. Muller
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J. Appl. Cryst.
(1980).
13
,
555-562
doi: 10.1107/S0021889880012769
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Projective properties of Laue topographs
J. Miltat
and
M. Dudley
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J. Appl. Cryst.
(1980).
13
,
563-571
doi: 10.1107/S0021889880012770
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An automated peak fitting procedure for processing protein diffraction data from a linear position-sensitive detector
S. A. Spencer
and
A. A. Kossiakoff
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J. Appl. Cryst.
(1980).
13
,
572-576
doi: 10.1107/S0021889880012782
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Application of the indirect transform method to obtaining distance distribution functions of extremely large colloids and emulsions using small-angle X-ray scattering data obtained with a Bonse–Hart instrument
C. W. Dwiggins Jnr
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J. Appl. Cryst.
(1980).
13
,
577-584
doi: 10.1107/S0021889880012794
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Evaluation of small-angle scattering data from lamellar and cylindrical particles by the indirect transformation method
O. Glatter
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J. Appl. Cryst.
(1980).
13
,
585-590
doi: 10.1107/S0021889880012800
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Intensity corrections for one-dimensional structure determination
B. Crist
and
C. R. Worthington
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J. Appl. Cryst.
(1980).
13
,
591-596
doi: 10.1107/S0021889880012812
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Electron microscopic study of small particles of tungsten oxide formed by the evaporation of tungsten trioxide
H. Shibahara
and
H. Hashimoto
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J. Appl. Cryst.
(1980).
13
,
597-600
doi: 10.1107/S0021889880012824
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Recherche des systèmes de glissement actifs dans un processus de déformation plastique du polycristal. III. Comportement du facteur de Taylor dans le cas du glissement cristallographique dans les cristaux cubiques
F. Royer
and
C. Tavard
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J. Appl. Cryst.
(1980).
13
,
601-604
doi: 10.1107/S0021889880012836
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A novel high-temperature tensile stage for live X-ray topography
H. Baumgart
,
G. Markewitz
and
W. Hartmann
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short communications
J. Appl. Cryst.
(1980).
13
,
605-607
doi: 10.1107/S0021889880012848
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An X-ray film powder profile refinement of the crystal structure of Ta
5
P
3
J. O. Thomas
,
N. O. Ersson
and
Y. Andersson
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J. Appl. Cryst.
(1980).
13
,
608-610
doi: 10.1107/S002188988001285X
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Molecular motions in a solid–solid transition of sodium dodecylsulphate
E. M. Macchi
,
F. J. Barrantes
and
G. E. Rigotti
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J. Appl. Cryst.
(1980).
13
,
611
doi: 10.1107/S0021889880012861
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The space group of γ-In
2
Se
3
and γ
1
-(Ga
x
In
1−
x
)
2
Se
3
: erratum
S. Popović
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crystal data
J. Appl. Cryst.
(1980).
13
,
611-612
doi: 10.1107/S0021889880012873
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X-ray powder diffraction data for 5'-azido-5'-deoxy-3'-
O
-acetylthymidine
D. F. Mullica
,
W. O. Milligan
,
W. B. Lunsford
and
M. Castro
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J. Appl. Cryst.
(1980).
13
,
613
doi: 10.1107/S0021889880012897
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Crystal data for new rare-earth thallates
M
III
Ti
III
O
3
(
M
=La,Nd)
B. L. Dubey
,
S. Lakshmi
,
I. Das
,
B. N. Tiwari
and
A. Tripathi
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J. Appl. Cryst.
(1980).
13
,
614-615
doi: 10.1107/S0021889880012903
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Crystal data for three new ammonium potassium pyrophosphates
K. R. Waerstad
and
A. W. Frazier
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J. Appl. Cryst.
(1980).
13
,
616-617
doi: 10.1107/S0021889880012915
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Données cristallographiques sur (−)-[Rh(en)
3
]Br
3
.H
2
O
P. Spinat
,
A. Whuler
and
C. Brouty
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J. Appl. Cryst.
(1980).
13
,
618-621
doi: 10.1107/S0021889880012927
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Space group and lattice constants of Ca
10
(PO
4
)
6
CO
3
J. C. Elliott
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J. Appl. Cryst.
(1980).
13
,
621
doi: 10.1107/S0021889880012939
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Crystal data for barium iodate monohydrate
M. S. Joshi
,
T. P. Singh
and
S. G. Trivedi
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J. Appl. Cryst.
(1980).
13
,
622-624
doi: 10.1107/S0021889880012940
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Crystal data for potassium and rubidium propanoates: C
2
H
5
COOK and C
2
H
5
COORb
V. Massarotti
and
G. Spinolo
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computer programs
J. Appl. Cryst.
(1980).
13
,
625-629
doi: 10.1107/S0021889880012952
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The
CRISTEP
desktop plotter system for molecular and crystallographic drawings
J. F. de Wet
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J. Appl. Cryst.
(1980).
13
,
630-633
doi: 10.1107/S0021889880012964
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EDINP
, the Edinburgh powder profile refinement program
G. S. Pawley
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laboratory notes
J. Appl. Cryst.
(1980).
13
,
633
doi: 10.1107/S0021889880012976
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A fast and accurate way of aligning X-ray cameras
S. Hovmöller
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J. Appl. Cryst.
(1980).
13
,
633-634
doi: 10.1107/S0021889880012988
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Reliable temperature readings in the low-temperature Guinier–Lenné camera
G. H. Kolkman
and
F. Tuinstra
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international union of crystallography
J. Appl. Cryst.
(1980).
13
,
634-635
doi: 10.1107/S002188988001299X
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Prices of
Acta Crystallographica
and
Journal of Applied Crystallography
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J. Appl. Cryst.
(1980).
13
,
635
doi: 10.1107/S0021889880013003
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Computing in Crystallography
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J. Appl. Cryst.
(1980).
13
,
635
doi: 10.1107/S0021889880013015
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Report of the Executive Committee for 1979
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J. Appl. Cryst.
(1980).
13
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636
doi: 10.1107/S0021889880013027
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J. Appl. Cryst.
(1980).
13
,
636
doi: 10.1107/S0021889880013039
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Ferroelectric films of metallic complex oxides
by Yu. Ya. Tomashpolsky
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J. Appl. Cryst.
(1980).
13
,
636-637
doi: 10.1107/S0021889880013040
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Current topics in materials science. Vol. 3
edited by E. Kaldis
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J. Appl. Cryst.
(1980).
13
,
637
doi: 10.1107/S0021889880013052
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Current topics in materials science. Vol. 4
edited by E. Kaldis
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J. Appl. Cryst.
(1980).
13
,
637-638
doi: 10.1107/S0021889880013064
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Handbook of semiconductors. Vol. 2. Optical properties of solids
edited by M. Balkanski
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