Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 15
|
Part 2
ISSN: 1600-5767
April 1982 issue
research papers
J. Appl. Cryst.
(1982).
15
,
143-147
doi: 10.1107/S0021889882011686
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Determination of the correlation function directly from slit-smeared small-angle X-ray scattering curves
T. Gerber
,
G. Walter
and
R. Kranold
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J. Appl. Cryst.
(1982).
15
,
148-153
doi: 10.1107/S0021889882011698
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A uniaxial stress apparatus for single-crystal X-ray diffraction on a four-circle diffractometer: application to silicon and diamond
H. d'Armour
,
W. Denner
,
H. Schulz
and
M. Cardona
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J. Appl. Cryst.
(1982).
15
,
154-159
doi: 10.1107/S0021889882011704
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Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection
C. S. G. Cousins
,
L. Gerward
,
J. Staun Olsen
,
B. Selsmark
and
B. J. Sheldon
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J. Appl. Cryst.
(1982).
15
,
160-166
doi: 10.1107/S0021889882011716
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Crystallographic computing on an array processor
W. Furey Jnr
,
B. C. Wang
and
M. Sax
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J. Appl. Cryst.
(1982).
15
,
167-173
doi: 10.1107/S0021889882011728
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The Cambridge Crystallography Subroutine Library
J. C. Matthewman
,
P. Thompson
and
P. J. Brown
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J. Appl. Cryst.
(1982).
15
,
174-181
doi: 10.1107/S002188988201173X
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Lattice modulation in the hexagonal-type antiphase domain structure of Au–33at.%Cd alloy
Y. Watanbe
and
H. Iwasaki
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J. Appl. Cryst.
(1982).
15
,
182-189
doi: 10.1107/S0021889882011741
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Examination of errors in the determination of phase boundary thickness by small-angle X-ray scattering
R.-J. Roe
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J. Appl. Cryst.
(1982).
15
,
190-198
doi: 10.1107/S0021889882011753
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Profile separation in complex powder patterns
S. V. N. Naidu
and
C. R. Houska
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J. Appl. Cryst.
(1982).
15
,
199-205
doi: 10.1107/S0021889882011765
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Two new SiC polytypes belonging to the [(44)
n
43]
3
structure family
C. L. Kuo
,
J. Zhou
,
H. Q. Ye
and
K. H. Kuo
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J. Appl. Cryst.
(1982).
15
,
206-210
doi: 10.1107/S0021889882011777
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A structural study of amorphous Fe4.7Co70.3Si15B10
D. E. G. Williams
,
H. Fujimori
and
D. S. Brown
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J. Appl. Cryst.
(1982).
15
,
211-215
doi: 10.1107/S0021889882011789
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Experimental and computed HREM images of the structure and defects in gadolinium silicate
H.-U. Nissen
,
A. Kumao
,
J. Ylä-Jääski
and
R. Wessicken
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J. Appl. Cryst.
(1982).
15
,
216-226
doi: 10.1107/S0021889882011790
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Laue photography of fine crystalline particles
I. T. Steinberger
,
U. Asaf
,
W. Graeff
and
Z. H. Kalman
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J. Appl. Cryst.
(1982).
15
,
227-231
doi: 10.1107/S0021889882011807
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Crystal cooling for protein crystallography with synchrotron radiation
H. D. Bartunik
and
P. Schubert
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J. Appl. Cryst.
(1982).
15
,
232-235
doi: 10.1107/S0021889882011819
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An
N
-pattern display for an SSD X-ray diffractometer
S. Hosoya
,
T. Sakamaki
,
Y. Nakano
and
T. Fukamachi
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J. Appl. Cryst.
(1982).
15
,
236-240
doi: 10.1107/S0021889882011820
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An X-ray camera for single-crystal studies at high temperatures under controlled atmosphere
W. Aldhart
,
N. Tzafaras
,
S. Sueno
,
H. Jagodzinski
and
H. Huber
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J. Appl. Cryst.
(1982).
15
,
241-244
doi: 10.1107/S0021889882011832
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A low-temperature X-ray Weissenberg goniometer with closed-cycle cooling to about 28 K
W. Adlhart
and
H. Huber
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crystal data
J. Appl. Cryst.
(1982).
15
,
245-246
doi: 10.1107/S0021889882011844
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Crystal data for two
cis-o
,
o'
-azodioxytoluene modifications
M. Azoulay
and
L. Trysberg
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J. Appl. Cryst.
(1982).
15
,
247-248
doi: 10.1107/S0021889882011856
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Crystal data for NH(CH
3
)
3
GeCl
3
A. Möller
and
J. Felsche
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J. Appl. Cryst.
(1982).
15
,
248
doi: 10.1107/S0021889882011868
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Crystal powder data of MoGa
5
(CuS
2
)
0.0556
R. Horyn
and
R. Andruszkiewicz
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crystallographers
J. Appl. Cryst.
(1982).
15
,
248-249
doi: 10.1107/S002188988201187X
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1982).
15
,
249
doi: 10.1107/S0021889882011881
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Commission on Journals. Chemical Formulae and Nomenclature
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J. Appl. Cryst.
(1982).
15
,
249-250
doi: 10.1107/S0021889882011893
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Commission on Journals. Decisions taken at meetings in Ottawa, August 1981
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J. Appl. Cryst.
(1982).
15
,
250
doi: 10.1107/S002188988201190X
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Fifty Years of Electron Diffraction
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J. Appl. Cryst.
(1982).
15
,
250
doi: 10.1107/S0021889882011911
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Molecular Structures and Dimensions
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J. Appl. Cryst.
(1982).
15
,
250
doi: 10.1107/S0021889882011923
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Structure Reports
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notes and news
J. Appl. Cryst.
(1982).
15
,
250
doi: 10.1107/S0021889882011935
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Seventh Euopean Crystallographic Meeting. Book of Abstracts
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