Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 15| Part 3

ISSN: 1600-5767

June 1982 issue

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research papers

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Characterization of Brazilian high-ash coals by small-angle X-ray diffraction methods

H. J. González, I. L. Torriani and C. A. Luengo

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The derivation of the axes of the conventional unit cell from the dimensions of the Buerger-reduced cell

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Studies of the cation atom distribution in ZnCr_xFe_2−xO₄ spinels using the channeling effect in electron-induced X-ray emission

J. Taftø and Z. Liliental

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On `spike' diffuse reflections in electron diffraction patterns of diamonds

N. Sumida and A. R. Lang

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Absolute lattice parameter measurements of epitaxial layers

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Etude des composés à chaînes aliphatiques. I. Synthèse et caractérisation cristallographique des bis(n-alcanoates) de pipérazinium, 2[C_xH_2x−1O₂⁻].[C₄H₁₂N₂²⁺]

F. Brisse, J. Denault and J.-P. Sangin

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Study of the ordered structures of the Au–Mn system by high voltage–high-resolution electron microscopy. III. Two-dimensional antiphase structure of Au₃Mn type

O. Terasaki and D. Watanabe

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Information content and retrieval in solution scattering studies. I. Degrees of freedom and data reduction

D. Taupin and V. Luzzati

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Study of adsorption on powders by surface differential diffraction measurements. Argon on Co₃O₄

J. P. Beaufils and Y. Barbaux

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Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer and A. B. P. Vogels

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The variance as a measure of line broadening: corrections for truncation, curvature and instrumental effects

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Reduction in a niobium tungsten bronze, 2Nb₂O₅.7WO₃, studied by 1 MV HRTEM

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Macromolecular crystallography with synchrotron radiation: photographic data collection and polarization correction

R. Kahn, R. Fourme, A. Gadet, J. Janin, C. Dumas and D. André

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Oscillation camera data processing: reflecting range and prediction of partiality. I. Conventional X-ray sources

T. J. Greenhough and J. R. Helliwell

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short communications

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Absorption effects from surface miscut in reflection diffractometry

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crystal data

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Crystal data for 3Al₂O₃.4SO₃.8H₂O

J. Ossaka, J. Hirabayashi, K. Okada and J. Harada

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Données cristallographiques de la dihydro-10,11 (quinuclidinyl 3)-5-5H-dibenzo[b, f]azépine (quinupramine)

J. P. Reboul, B. Cristau, C. Caranoni and L. Capella

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laboratory notes

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Conception et réalisation d'un dispositif de refroidissement par effet Peltier destiné à la diffractométrie X de poudres cristallines

R. Auby, P. Bregeaut and M. Massaux

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A technique for loading glass capillaries used in X-ray powder diffraction

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letters to the editor

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Suggested guidelines for the publication of Rietveld analyses and pattern decomposition studies

R. A. Young, E. Prince and R. A. Sparks

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crystallographers

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Crystallographers

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international union of crystallography

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Structure Reports

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book reviews

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Advances in X-ray analysis, Vol. 24 edited by D. K. Smith, C. S. Barrett, D. E. Leyden and P. K. Predecki

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Quantitative X-ray spectrometry by R. Jenkins, R. W. Gould and D. Gedcke

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