Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 16
|
Part 4
ISSN: 1600-5767
August 1983 issue
research papers
J. Appl. Cryst.
(1983).
16
,
363-369
doi: 10.1107/S0021889883010638
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A rotating-crystal pulse shaper for use on a pulsed neutron source
J. M. Carpenter
and
C. J. Carlile
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J. Appl. Cryst.
(1983).
16
,
370-373
doi: 10.1107/S002188988301064X
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Caractérisation du polymorphisme du méthyl-2 naphtalène
A. Meresse
,
N. B. Chanh
,
J. Housty
and
Y. Haget
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J. Appl. Cryst.
(1983).
16
,
374-383
doi: 10.1107/S0021889883010651
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Use of diffraction and Mössbauer methods for the structural and crystallochemical characterization of nontronites
G. Besson
,
A. S. Bookin
,
L. G. Dainyak
,
M. Rautureau
,
S. I. Tsipursky
,
C. Tchoubar
and
V. A. Drits
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J. Appl. Cryst.
(1983).
16
,
384-389
doi: 10.1107/S0021889883010663
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Small-angle scattering with azimuthal asymmetry
G. C. Summerfield
and
D. F. R. Mildner
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J. Appl. Cryst.
(1983).
16
,
390-398
doi: 10.1107/S0021889883010675
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The growth and perfection of crystals of ammonium dihydrogen orthophosphate, NH
4
H
2
PO
4
. I. Dislocation characterization in self-nucleated crystals
H. L. Bhat
,
K. J. Roberts
and
J. N. Sherwood
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J. Appl. Cryst.
(1983).
16
,
399-403
doi: 10.1107/S0021889883010687
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Growth defects in a quartz druse <
a
+
c
> dislocations
E. Scandale
,
F. Stasi
and
A. Zarka
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J. Appl. Cryst.
(1983).
16
,
404-406
doi: 10.1107/S0021889883010699
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Counting statistics and powder diffraction scan refinements
E. Baharie
and
G. S. Pawley
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J. Appl. Cryst.
(1983).
16
,
407-414
doi: 10.1107/S0021889883010705
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New procedures for quantitative studies of diffuse X-ray scattering
T. B. Wu
,
E. Matsubara
and
J. B. Cohen
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J. Appl. Cryst.
(1983).
16
,
415-419
doi: 10.1107/S0021889883010717
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X-ray diffraction study of the system Ga
2
Se
3
–In
2
Te
3
B. Gržeta-Plenković
,
S. Popović
,
B. Čelustka
,
Ž. Ružić-Toroš
,
B. Šantić
and
D. Soldo
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J. Appl. Cryst.
(1983).
16
,
420-427
doi: 10.1107/S0021889883010729
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Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation
H. Hashizume
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short communications
J. Appl. Cryst.
(1983).
16
,
428-429
doi: 10.1107/S0021889883010730
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A simple Gandolfi attachment for a Debye–Scherrer camera and its use in a forensic science laboratory
D. F. Rendle
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crystal data
J. Appl. Cryst.
(1983).
16
,
430
doi: 10.1107/S0021889883010742
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Données crystallographiques sur les composés Cu(C
15
H
11
N
3
)
X
2
:
X
=Br
−
, I
−
F. J. Ruiz
,
J. L. Mesa
,
T. Rojo
and
M. I. Arriortua
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J. Appl. Cryst.
(1983).
16
,
430
doi: 10.1107/S0021889883010754
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Crystal data for dilead(II) pentaoxosulfate(VI), Pb
2
SO
5
B. F. Mentzen
and
A. Latrach
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J. Appl. Cryst.
(1983).
16
,
430
doi: 10.1107/S0021889883010766
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Crystal data for rhombohedral Pb
3
[Ge
2
O
7
]isotypic with Pb-barysilite
H. H. Otto
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computer programs
J. Appl. Cryst.
(1983).
16
,
431-432
doi: 10.1107/S0021889883010778
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PUCK
2, an improved version of the Cremer–Pople puckering program
P. Luger
and
R. Bülow
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J. Appl. Cryst.
(1983).
16
,
432-437
doi: 10.1107/S002188988301078X
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DOCKER
, an interactive program for simulating protein receptor and substrate interactions
B. Busetta
,
I. J. Tickle
and
T. L. Blundell
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J. Appl. Cryst.
(1983).
16
,
437
doi: 10.1107/S0021889883010791
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Calculation of anomalous scattering factors at arbitrary wavelengths
D. T. Cromer
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notes and news
J. Appl. Cryst.
(1983).
16
,
438
doi: 10.1107/S0021889883010808
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