Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 16
|
Part 5
ISSN: 1600-5767
October 1983 issue
research papers
J. Appl. Cryst.
(1983).
16
,
439-448
doi: 10.1107/S002188988301081X
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Etude du gonflement des vermiculites–ornithine en solution saline par analyse de la diffusion des rayons X aux petits angles. Méthode d'interprétation et recherche des paramètres d'ordre
J. Saez-Auñon
,
C. H. Pons
,
J. E. Iglesias
and
J. A. Rausell-Colom
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J. Appl. Cryst.
(1983).
16
,
449-452
doi: 10.1107/S0021889883010821
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A variable-temperature sample container for low-temperature neutron powder diffraction
E. Arzi
and
E. Sándor
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J. Appl. Cryst.
(1983).
16
,
453-457
doi: 10.1107/S0021889883010833
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Thermal expansivity of α-LiIO
3
between 20 and 520 K
S. C. Abrahams
,
R. Liminga
,
P. Marsh
,
F. Schrey
,
J. Albertsson
,
C. Svensson
and
Å. Kvick
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J. Appl. Cryst.
(1983).
16
,
458-472
doi: 10.1107/S0021889883010845
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X-ray Rietveld refinement using Debye–Scherrer geometry
P. Thompson
and
I. G. Wood
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J. Appl. Cryst.
(1983).
16
,
473-478
doi: 10.1107/S0021889883010857
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An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors
T. P. Russell
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J. Appl. Cryst.
(1983).
16
,
479-485
doi: 10.1107/S0021889883010869
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Assessment of parameter accuracies in profile analysis of white-beam neutron powder diffraction experiments
H. Pöyry
and
K. J. Tilli
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J. Appl. Cryst.
(1983).
16
,
486-492
doi: 10.1107/S0021889883010870
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Precision interplanar spacing measurements of boron-doped silicon
D. A. W. Soares
and
C. A. Pimentel
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J. Appl. Cryst.
(1983).
16
,
493-497
doi: 10.1107/S0021889883010882
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A computer X-ray quantitative phase analysis
Z. Weiss
,
J. Krajíček
,
L. Smrčok
and
J. Fiala
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J. Appl. Cryst.
(1983).
16
,
498-504
doi: 10.1107/S0021889883010894
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A medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering
J. Kulda
and
P. Mikula
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J. Appl. Cryst.
(1983).
16
,
505-507
doi: 10.1107/S0021889883010900
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The doping method in quantitative X-ray diffraction phase analysis. Addendum
S. Popović
,
B. Gržeta-Plenković
and
T. Balić-Žunić
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J. Appl. Cryst.
(1983).
16
,
508-511
doi: 10.1107/S0021889883010912
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The effect of finite detector slit height on peak positions and shapes in powder diffraction
E. Prince
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J. Appl. Cryst.
(1983).
16
,
512-518
doi: 10.1107/S0021889883010924
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Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites
R. Vargas
,
D. Louër
and
J. I. Langford
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J. Appl. Cryst.
(1983).
16
,
519-523
doi: 10.1107/S0021889883010936
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Analysis of anisotropy of small-angle neutron scattering of polyethylene single crystals
D. M. Sadler
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J. Appl. Cryst.
(1983).
16
,
524-531
doi: 10.1107/S0021889883010948
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Monolithic double-grooved-crystal monochromators with tunable harmonic suppression for neutrons and X-rays
U. Bonse
,
K. Olthoff-Münter
and
A. Rumpf
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J. Appl. Cryst.
(1983).
16
,
532-534
doi: 10.1107/S002188988301095X
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Eccentricity corrections for a modified Debye–Scherrer camera
L. K. Frevel
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J. Appl. Cryst.
(1983).
16
,
535-541
doi: 10.1107/S0021889883010961
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Can inherited textures in the B.c.c. phase furnish information about the type of transformation from the F.c.c. phase?
V. Jung
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J. Appl. Cryst.
(1983).
16
,
542-547
doi: 10.1107/S0021889883010973
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A focusing Weissenberg camera with multi-layer-line screens for macromolecular crystallography
N. Sakabe
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J. Appl. Cryst.
(1983).
16
,
548-558
doi: 10.1107/S0021889883010985
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Analytical molecular surface calculation
M. L. Connolly
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J. Appl. Cryst.
(1983).
16
,
559-562
doi: 10.1107/S0021889883010997
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A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites
S. Simov
,
E. Simova
,
B. Davidkov
and
G. Mechenov
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J. Appl. Cryst.
(1983).
16
,
563-571
doi: 10.1107/S0021889883011000
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A small-angle camera for resonant scattering experiments at the storage ring DORIS
H. B. Stuhrmann
and
A. Gabriel
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short communications
J. Appl. Cryst.
(1983).
16
,
572-573
doi: 10.1107/S0021889883011012
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Detector aperture size in the conventional estimation of integrated intensity in the
/20 scan mode
A. McL Mathieson
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J. Appl. Cryst.
(1983).
16
,
573-575
doi: 10.1107/S0021889883011024
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Error in 2π from single-crystal diffractometers due to sample absorption in a divergent primary beam
C. Svensson
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crystal data
J. Appl. Cryst.
(1983).
16
,
575
doi: 10.1107/S0021889883011036
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Crystal data for Rb
2
CoCl
4
.2H
2
O
J. Hybler
and
M. Havránková
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J. Appl. Cryst.
(1983).
16
,
575
doi: 10.1107/S0021889883011048
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Crystal data for magnesium decavanadate. Mg
3
V
10
O
28
28.H
2
O
G. Rigotti
,
M. E. Escobar
and
E. J. Baran
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J. Appl. Cryst.
(1983).
16
,
576
doi: 10.1107/S002188988301105X
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Crystal data for CuGa
x
In
1−
x
Te
2
B. Gržeta-Plenković
and
B. Šantić
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J. Appl. Cryst.
(1983).
16
,
576
doi: 10.1107/S0021889883011061
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Studies on rare-earth carboxylates. II. Crystal chemical data on Ln(CH
3
CHCH
3
COO)
3
where Ln=Er, Tm or Yb
M. A. Nabar
and
S. D. Barve
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J. Appl. Cryst.
(1983).
16
,
576-577
doi: 10.1107/S0021889883011073
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Crystal data for two orthorphosphates α-NaCuPO
4
and β-AgCuPO
4
M. Quarton
,
M. T. Oumba
and
A. W. Kolsi
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computer programs
J. Appl. Cryst.
(1983).
16
,
577-578
doi: 10.1107/S0021889883011085
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A computer program generating parameters useful in X-ray diffraction topography studies
K. J. Roberts
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laboratory notes
J. Appl. Cryst.
(1983).
16
,
579
doi: 10.1107/S0021889883011097
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A remote-control direct-beam exposure device for the Arndt–Wonacott rotation camera
J. R. Helliwell
and
A. W. Thompson
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crystallographers
J. Appl. Cryst.
(1983).
16
,
580
doi: 10.1107/S0021889883011103
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Free
Crystallographers
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book reviews
J. Appl. Cryst.
(1983).
16
,
580
doi: 10.1107/S0021889883011115
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Free
Industrial crystallization 81
edited by S. J. Jancic and E. J. de Jong
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books received
J. Appl. Cryst.
(1983).
16
,
580
doi: 10.1107/S0021889883011127
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ICOTOM-6
edited by S. Nagashima
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