Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 16| Part 5

ISSN: 1600-5767

October 1983 issue

research papers

Etude du gonflement des vermiculites–ornithine en solution saline par analyse de la diffusion des rayons X aux petits angles. Méthode d'interprétation et recherche des paramètres d'ordre

J. Saez-Auñon, C. H. Pons, J. E. Iglesias and J. A. Rausell-Colom

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A variable-temperature sample container for low-temperature neutron powder diffraction

E. Arzi and E. Sándor

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Thermal expansivity of α-LiIO₃ between 20 and 520 K

S. C. Abrahams, R. Liminga, P. Marsh, F. Schrey, J. Albertsson, C. Svensson and Å. Kvick

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X-ray Rietveld refinement using Debye–Scherrer geometry

P. Thompson and I. G. Wood

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An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors

T. P. Russell

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Assessment of parameter accuracies in profile analysis of white-beam neutron powder diffraction experiments

H. Pöyry and K. J. Tilli

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Precision interplanar spacing measurements of boron-doped silicon

D. A. W. Soares and C. A. Pimentel

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A computer X-ray quantitative phase analysis

Z. Weiss, J. Krajíček, L. Smrčok and J. Fiala

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A medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering

J. Kulda and P. Mikula

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The doping method in quantitative X-ray diffraction phase analysis. Addendum

S. Popović, B. Gržeta-Plenković and T. Balić-Žunić

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The effect of finite detector slit height on peak positions and shapes in powder diffraction

E. Prince

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Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites

R. Vargas, D. Louër and J. I. Langford

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Analysis of anisotropy of small-angle neutron scattering of polyethylene single crystals

D. M. Sadler

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Monolithic double-grooved-crystal monochromators with tunable harmonic suppression for neutrons and X-rays

U. Bonse, K. Olthoff-Münter and A. Rumpf

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Eccentricity corrections for a modified Debye–Scherrer camera

L. K. Frevel

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Can inherited textures in the B.c.c. phase furnish information about the type of transformation from the F.c.c. phase?

V. Jung

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A focusing Weissenberg camera with multi-layer-line screens for macromolecular crystallography

N. Sakabe

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Analytical molecular surface calculation

M. L. Connolly

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A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites

S. Simov, E. Simova, B. Davidkov and G. Mechenov

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A small-angle camera for resonant scattering experiments at the storage ring DORIS

H. B. Stuhrmann and A. Gabriel

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short communications

Detector aperture size in the conventional estimation of integrated intensity in the $\def\lambdabar{\ifvmode\noindent\fi{\hbox{$\lambda$}\kern-0.35em\raise0.7ex\hbox{-}\kern0.2em}}\lambdabar$ /20 scan mode

A. McL Mathieson

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Error in 2π from single-crystal diffractometers due to sample absorption in a divergent primary beam

C. Svensson

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crystal data

Crystal data for Rb₂CoCl₄.2H₂O

J. Hybler and M. Havránková

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Crystal data for magnesium decavanadate. Mg₃V₁₀O₂₈28.H₂O

G. Rigotti, M. E. Escobar and E. J. Baran

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Crystal data for CuGa_xIn_1−xTe₂

B. Gržeta-Plenković and B. Šantić

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Studies on rare-earth carboxylates. II. Crystal chemical data on Ln(CH₃CHCH₃COO)₃ where Ln=Er, Tm or Yb

M. A. Nabar and S. D. Barve

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Crystal data for two orthorphosphates α-NaCuPO₄ and β-AgCuPO₄

M. Quarton, M. T. Oumba and A. W. Kolsi

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computer programs

A computer program generating parameters useful in X-ray diffraction topography studies

K. J. Roberts

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laboratory notes

A remote-control direct-beam exposure device for the Arndt–Wonacott rotation camera

J. R. Helliwell and A. W. Thompson

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crystallographers

Crystallographers

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book reviews

Industrial crystallization 81 edited by S. J. Jancic and E. J. de Jong

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books received

ICOTOM-6 edited by S. Nagashima

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