Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 17
|
Part 2
ISSN: 1600-5767
April 1984 issue
research papers
J. Appl. Cryst.
(1984).
17
,
47-54
doi: 10.1107/S0021889884011006
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The peak in neutron powder diffraction
B. van Laar
and
W. B. Yelon
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J. Appl. Cryst.
(1984).
17
,
55-60
doi: 10.1107/S0021889884011018
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Use of the Rietveld technique for estimating cation distributions
A. G. Nord
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J. Appl. Cryst.
(1984).
17
,
61-76
doi: 10.1107/S002188988401102X
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The accuracy of experimental radial distribution functions for metallic glasses
B. J. Thijsse
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J. Appl. Cryst.
(1984).
17
,
77-84
doi: 10.1107/S0021889884011031
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Scaling and phase-difference determination in solvent contrast variation experiments
M. Roth
,
A. Lewit-Bentley
and
G. A. Bentley
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J. Appl. Cryst.
(1984).
17
,
85-95
doi: 10.1107/S0021889884011043
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Synchrotron X-ray powder diffraction
J. B. Hastings
,
W. Thomlinson
and
D. E. Cox
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J. Appl. Cryst.
(1984).
17
,
96-99
doi: 10.1107/S0021889884011055
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Simulation of industrial furnacing with powder X-ray diffraction
S. E. Tarling
,
P. Barnes
and
A. L. Mackay
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J. Appl. Cryst.
(1984).
17
,
100-102
doi: 10.1107/S0021889884011067
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X-ray study on the successive phase transition in cholesteryl 2,2,3,3-tetrafluoropionate (CTFP)
N. Nakamura
,
Y. Yoshimura
,
K. Shimaoka
and
S. Yano
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J. Appl. Cryst.
(1984).
17
,
103-110
doi: 10.1107/S0021889884011079
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On the texture in diffusion-grown layers of silicides and germanides with the FeB structure, Me
X
(Me=Ti, Zr;
X
=Si, Ge) or the ZrSi
2
structure (ZrSi
2
, HfSi
2
, ZrGe
2
)
J. H. Maas
,
G. F. Bastin
,
F. J. J. van Loo
and
R. Metselaar
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J. Appl. Cryst.
(1984).
17
,
111-117
doi: 10.1107/S0021889884011080
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An assessment of diamond turning for the production of silicon X-ray optical elements
S. M. Abdul Gani
,
B. K. Tanner
,
T. G. McKenney
,
H. T. Tingle
and
D. K. Bowen
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short communications
J. Appl. Cryst.
(1984).
17
,
118-119
doi: 10.1107/S0021889884011092
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Optimum X-ray wavelength for protein crystallography
U. W. Arndt
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laboratory notes
J. Appl. Cryst.
(1984).
17
,
120
doi: 10.1107/S0021889884011109
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An optimized collimator for X-ray diffraction from very small samples using synchrotron radiation
H. D. Bartunik
,
T. Gehrmann
and
B. Robrahn
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J. Appl. Cryst.
(1984).
17
,
120-121
doi: 10.1107/S0021889884011110
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A device for the easy centering of a Gandolfi X-ray diffraction camera
H. de Bruiyn
,
W. A. van der Westhuizen
and
G. J. Beukes
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J. Appl. Cryst.
(1984).
17
,
122
doi: 10.1107/S0021889884011122
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Diffractometer detector aperture system with independently controlled jaws
A. McL Mathieson
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crystallographers
J. Appl. Cryst.
(1984).
17
,
122
doi: 10.1107/S0021889884011134
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1984).
17
,
122
doi: 10.1107/S0021889884011146
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Appreciation of Co-editor's Service
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book reviews
J. Appl. Cryst.
(1984).
17
,
123
doi: 10.1107/S0021889884011158
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Crystals: growth, properties and applications. Vol. 7 and Vol. 8
edited by H. C. Freyhardt
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J. Appl. Cryst.
(1984).
17
,
123-124
doi: 10.1107/S002188988401116X
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Crystal lattices, interfaces, matrices
by W. Bollmann
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