Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 17| Part 4

ISSN: 1600-5767

August 1984 issue

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research papers

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Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer

T. Sakamaki, S. Hosoya, T. Tagai, K. Ohsumi and Y. Satow

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Absorption factor for cylindrical samples

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Use of synchrotron radiation sources for X-ray diffraction topography of polytypic structures

G. R. Fisher and P. Barnes

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Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography

G. N. Reeke Jnr

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OMITMAP: An electron density map suitable for the examination of errors in a macromolecular model

T. N. Bhat and G. H. Cohen

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Optimization of the experimental resolution for small-angle scattering

D. F. R. Mildner and J. M. Carpenter

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High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrors

T. Matsushita, T. Ishikawa and K. Kohra

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Laue orientation and interpretation by microcomputer

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Determination of particle distribution in supported metal catalysts by small-angle scattering

D. Espinat, B. Moraweck, J. F. Larue and A. J. Renouprez

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Accuracy and resolution in protein crystallography: a probabilistic approach

V. Luzzati and D. Taupin

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Détermination des indices hkl en rayonnement polychromatique par la méthode des marqueurs de longueurs d'onde. Application à l'étude de structures modulées

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short communications

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Comments on Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

D. F. R. Mildner

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laboratory notes

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An X-ray microdiffractometer for the analysis of small specimens, and its use in a forensic science laboratory

R. C. Banks, D. F. Rendle and J. R. Russell

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