Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 17| Part 5

ISSN: 1600-5767

October 1984 issue

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research papers

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The effect of profile-step counting time on the determination of crystal structure parameters by X-ray Rietveld analysis

R. J. Hill and I. C. Madsen

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The many-beam moiré effect in electron micrographs of epitaxic Sn/SnTe layers

K. Kranjc, D. Kunstelj, P. Pećina and V. Marinković

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Vibrating crystals as possible neutron monochromators

A. D. Stoica and M. Popovici

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Dislocations in energetic materials. 2. Characterization of the growth-induced dislocation structure of pentaerythritol tetranitrate (PETN)

P. J. Halfpenny, K. J. Roberts and J. N. Sherwood

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The formation of macroscopic polytypic regions in ZnS crystals

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The true unit cell of ammonium hydrogen sulfate, (NH₄)₃H(SO₄)₂

B. L. Davis and L. R. Johnson

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Enhancement of the `auto-indexing' method for cell determination in four-circle diffractometry

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A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

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Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation

J. J. Hoyt, D. de Fontaine and W. K. Warburton

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A Voigtian as profile shape function in Rietveld refinement

M. Ahtee, L. Unonius, M. Nurmela and P. Suortti

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short communications

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A low-temperature cooler for protein crystallography

K. J. Machin, G. S. Begg and N. W. Isaacs

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Thermal expansion coefficients of a binary alloy Ni₈₀Zr₂₀ at elevated temperatures

S. K. Shadangi, U. K. Shadangi and S. C. Panda

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A segment description for the unique set of reflections in non-centrosymmetric crystal classes

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Some aspects of the X-ray structural characterization of (Ga_1−xAl_xAs)n1(GaAs)n2/GaAs(001) superlattices: erratum

J. Kervarec, M. Baudet, J. Caulet, P. Auvrey, J. Y. Emery and A. Regreny

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crystal data

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Crystal data for triuraniumpentoxide pyrophosphate, U₃O₅P₂O₇

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Crystal data for 7HgI₂Fe(C₅H₅)₂

J. Votinský, L. Beneš, J. Klikorka, J. Kalousová, J. Horák and P. Lošťák

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computer programs

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On the automatic extension of incomplete models by iterative Fourier calculation

A. J. Kinneging and R. A. G. de Graaff

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An enhanced interactive PLUTO78 for molecular display

K. M. Crennell and G. M. Crisp

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letters to the editor

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Recommendations of the Ad hoc committee on criteria for publication of charge density studies

P. J. Becker, P. Coppens and F. L. Hirshfeld

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laboratory notes

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A sample holder for cutting single crystals along any desired X-ray oriented plane

C. F. Desai and V. P. Bhatt

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Use of a one-dimensional position-sensitive detector with a Kratky camera

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The use of silicones in protein crystallizations involving single or multiple growth cycles

W. J. Ray Jnr and J. M. Puvathingal

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A technique for the preparation of low-temperature powder samples of noxious materials

H. F. Nieman, J. C. Evans, K. M. Heal and B. M. Powell

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meeting reports

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The 50th anniversary of the pepsin X-ray photograph

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crystallographers

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Crystallographers

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notes and news

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Notes and News

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