Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 18| Part 1

ISSN: 1600-5767

February 1985 issue

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international union of crystallography

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Checklist for Authors of Papers Submitted to Journal of Applied Crystallography

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research papers

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Two new X-ray films: conditions for optimum development and calibration of response

W. C. Phillips and G. N. Jr Phillips

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Differential X-ray diffraction: a theoretical basis for a technique based on wavelength variation

M. C. Nichols, D. K. Smith and Q. Johnson

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Focusing monochromators for pulsed neutron sources

C. J. Carlile and R. C. Ward

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Single-crystal diffractometry: strategy for rapidly decaying poorly diffracting crystals

J. Fischer, D. Moras and J. C. Thierry

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A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions

P. A. Aleksandrov, A. M. Afanas'ev, A. L. Golovin, R. M. Imamov, D. V. Novikov and S. A. Stepanov

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Angle and index calculations for `z-axis' X-ray diffractometer

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A new high-pressure phase of uranium nitride studied by X-ray diffraction and synchrotron radiation

J. Staun Olsen, L. Gerward and U. Benedict

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A treatment of instrumental smearing effects in circularly symmetric small-angle scattering

V. Ramakrishnan

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short communications

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On the structure of the M' phase in Al–Zn–Mg alloys

J. H. Auld and S. M. Cousland

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Rietveld analysis of powder neutron diffraction data displaying anisotropic crystallite size broadening

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computer programs

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The GX crystallographic program system

P. R. Mallinson and K. W. Muir

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crystallographers

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Crystallographers

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book reviews

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Structure of crystalline polymers edited by I. H. Hall

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books received

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Molecular beam epitaxy of III-V compounds: a comprehensive bibliography, 1958-1983 edited by K. Ploog

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Dry etching for microelectronics edited by R. A. Powell

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