Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 19
|
Part 1
ISSN: 1600-5767
February 1986 issue
research papers
J. Appl. Cryst.
(1986).
19
,
1-6
doi: 10.1107/S002188988609009X
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A new radiative single-crystal diffractometer microfurnace incorporating MgO as a high-temperature cement and internal temperature calibrant
D. K. Swanson
and
C. T. Prewitt
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J. Appl. Cryst.
(1986).
19
,
7-9
doi: 10.1107/S0021889886090088
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The influence of high hydrostatic pressure on lattice parameters of a single crystal of BaTiO
3
M. Malinowski
,
K. Łukaszewicz
and
S. Åsbrink
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J. Appl. Cryst.
(1986).
19
,
10-18
doi: 10.1107/S0021889886090076
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The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis
R. J. Hill
and
I. C. Madsen
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J. Appl. Cryst.
(1986).
19
,
19-24
doi: 10.1107/S0021889886090064
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Anomalous small-angle scattering in metallurgy: a feasibility experiment with an Al–Zn alloy
P. Goudeau
,
A. Fontaine
,
A. Naudon
and
C. E. Williams
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J. Appl. Cryst.
(1986).
19
,
25-27
doi: 10.1107/S0021889886090052
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Scattering exponents for polydisperse surface and mass fractals
J. E. Martin
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J. Appl. Cryst.
(1986).
19
,
28-33
doi: 10.1107/S0021889886090040
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A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs
P. Dumas
and
R. Ripp
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J. Appl. Cryst.
(1986).
19
,
34-38
doi: 10.1107/S0021889886090039
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Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles
H. Berger
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J. Appl. Cryst.
(1986).
19
,
39-50
doi: 10.1107/S0021889886090027
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Information content and retrieval in solution scattering studies. II. Evaluation of accuracy and resolution
V. Luzzati
and
D. Taupin
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J. Appl. Cryst.
(1986).
19
,
51-60
doi: 10.1107/S0021889886090015
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Accuracy and resolution in small-angle crystallographic analyses. A comparison with solution scattering studies
V. Luzzati
and
D. Taupin
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short communications
J. Appl. Cryst.
(1986).
19
,
61-62
doi: 10.1107/S0021889886090003
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Strategies for collecting screen-less oscillation data
S. K. Munshi
and
M. R. N. Murthy
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J. Appl. Cryst.
(1986).
19
,
63-64
doi: 10.1107/S0021889886089999
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Powder diffraction peak shapes. Parameterization of the pseudo-Voigt as a Voigt function
W. I. F. David
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crystal data
J. Appl. Cryst.
(1986).
19
,
65
doi: 10.1107/S0021889886089987
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Supporting information
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Crystal data for
p
-bromochlorobenzene and
p
-dichlorobenzene
/p
-bromochlorobenzene mixed crystals at 293 K. Erratum
M. Labrador
,
E. Tauler
,
Y. Haget
,
T. Calvet
,
M. A. Cuevas
and
E. Estop
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computer programs
J. Appl. Cryst.
(1986).
19
,
65-66
doi: 10.1107/S0021889886089975
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PITMOS
– a system of interactive computer programs for visualization of crystal packing
S. Pérez
and
R. P. Scaringe
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crystallographers
J. Appl. Cryst.
(1986).
19
,
67
doi: 10.1107/S0021889886089963
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Crystallographers
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notes and news
J. Appl. Cryst.
(1986).
19
,
67
doi: 10.1107/S0021889886089951
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Notes and News
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new commercial products
J. Appl. Cryst.
(1986).
19
,
67-68
doi: 10.1107/S002188988608994X
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New Commercial Products
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books received
J. Appl. Cryst.
(1986).
19
,
68
doi: 10.1107/S0021889886089938
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Semiconductor physics: an introduction
by K. Seeger
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J. Appl. Cryst.
(1986).
19
,
68
doi: 10.1107/S0021889886089926
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Metamorphic reactions: kinetics, textures and deformation
edited by A. B. Thompson and D. C. Rubie
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