Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 19
|
Part 2
ISSN: 1600-5767
April 1986 issue
research papers
J. Appl. Cryst.
(1986).
19
,
69-72
doi: 10.1107/S0021889886089914
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Bravais-lattice determination for automatic data collection
C. Katayama
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J. Appl. Cryst.
(1986).
19
,
73-76
doi: 10.1107/S0021889886089902
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A test of the accuracy of high-pressure measurements using a Merrill–Bassett diamond-anvil cell
A. Katrusiak
and
R. J. Nelmes
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J. Appl. Cryst.
(1986).
19
,
77-79
doi: 10.1107/S0021889886089896
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The generalized equation of pseudo-Kossel lines
W. E. Mayo
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J. Appl. Cryst.
(1986).
19
,
80-85
doi: 10.1107/S0021889886089884
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Einfluss der Valenzelektronenkonzentration auf die Bildung der Phasen vom Ni
2
In-Strukturtyp am Beispiel der ternären Verbindungen Mn
2
Ga
0.5
As
0.5
(
m
),Fe
3
GaAs und Co
2
Ga
0.5
As
0.5
M. Ellner
and
M. El-Boragy
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J. Appl. Cryst.
(1986).
19
,
86-89
doi: 10.1107/S0021889886089872
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Lattice thermal expansion behaviour of spinel HgCr
2
Se
4
P. Kistaiah
,
C. V. Reddy
and
K. S. Murthy
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J. Appl. Cryst.
(1986).
19
,
90-91
doi: 10.1107/S0021889886089860
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CAMAL
– a new component of the Cambridge Structural Database software system
R. Taylor
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J. Appl. Cryst.
(1986).
19
,
92-100
doi: 10.1107/S0021889886089859
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Synchrotron X-ray polycrystalline diffractometry
W. Parrish
,
M. Hart
and
T. C. Huang
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J. Appl. Cryst.
(1986).
19
,
101-104
doi: 10.1107/S0021889886089847
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Interactive graphics for rapid indexing of oscillation films from large unit cells
P. C. Moews
,
T. Sakamaki
and
J. R. Knox
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J. Appl. Cryst.
(1986).
19
,
105-107
doi: 10.1107/S0021889886089835
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A nitrogen-gas-stream cryostat for general X-ray diffraction studies
J. Cosier
and
A. M. Glazer
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J. Appl. Cryst.
(1986).
19
,
108-122
doi: 10.1107/S0021889886089823
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On the origin of optical activity in crystal structures
A. M. Glazer
and
K. Stadnicka
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J. Appl. Cryst.
(1986).
19
,
123-130
doi: 10.1107/S0021889886089811
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High-reflectivity multilayer monochromators for neutrons
A. M. Saxena
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J. Appl. Cryst.
(1986).
19
,
131-133
doi: 10.1107/S002188988608980X
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The determination of molecular orientation: an efficient reciprocal-space algorithm for the small computer
D. A. Langs
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J. Appl. Cryst.
(1986).
19
,
134-139
doi: 10.1107/S0021889886089793
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Post-refinement of oscillation diffraction data collected at a synchrotron radiation source
G. Vriend
,
M. G. Rossmann
,
E. Arnold
,
M. Luo
,
J. P. Griffith
and
K. Moffat
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J. Appl. Cryst.
(1986).
19
,
140-141
doi: 10.1107/S0021889886089781
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Identification of Burgers vectors along <111> in In-doped GaAs, by X-ray transmission topography and image simulation
N. Burle-Durbec
,
B. Pichaud
,
F. Minari
,
A. Soyer
and
Y. Epelboin
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crystal data
J. Appl. Cryst.
(1986).
19
,
142
doi: 10.1107/S002188988608977X
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Crystal data for 1-4-epoxy-4-[(4-nitrophenyl)methyl]-1-phenyl-1
H
-2,3-benzodioxepin-5(4
H
)-one (C
22
H
15
NO
6
) and 1,4-epoxy-4-[(4-bromophenyl)methyl]-1-phenyl-1
H
-2,3-benzodioxepin-5(4
H
)-one (C
22
H
15
BrO
4
)
D. F. Mullica
,
J. S. Belew
and
E. L. Sappenfield
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J. Appl. Cryst.
(1986).
19
,
142
doi: 10.1107/S0021889886089768
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Crystal data for di-μ-chloro-bis[2-(di-
tert
-butylphosphino)-2-methylpropyl]dipalladium(II) (C
24
H
52
Cl
2
P
2
Pd
2
) and [2(di-
tert
-butylphosphino)-2-methylpropyl]triphenylarsinopalladium(II) chloride (C
30
H
41
AsClPPd)
D. F. Mullica
and
E. L. Sappenfield
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laboratory notes
J. Appl. Cryst.
(1986).
19
,
143
doi: 10.1107/S0021889886089756
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A comparison of the source emissivity distributions for two standard X-ray tubes
A. W. Stevenson
,
A. M. Mathieson
and
A. H. White
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book reviews
J. Appl. Cryst.
(1986).
19
,
144
doi: 10.1107/S0021889886089744
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Free
Phase separation in glass
edited by O. V. Mazurin and E. A. Porai-Koshits
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