Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 19| Part 5

ISSN: 1600-5767

October 1986 issue

research papers

An orientation-matrix approach to Laue indexing

R. A. Jacobson

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Small-angle X-ray scattering analysis of catalysts: comparison and evaluation of models

H. Brumberger, F. Delaglio, J. Goodisman and M. Whitfield

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The accuracy of stress measurement using the X-ray diffraction method

D. Lonsdale

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Structural stability and equation of state of thorium carbide for pressures up to 36 GPa

L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itíe and J. C. Spirlet

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Measurement and calculation of resolution of time-of-flight small-angle neutron scattering

D. F. R. Mildner, J. M. Carpenter and D. L. Worcester

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The inclination angle of nonisotropic inhomogeneities determined by SANS

B. Hammouda, D. F. R. Mildner, R. A. Bubeck and M. T. Malanga

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The spatial condensation of the neutron beam by an asymmetric diffraction in thermal-neutron monochromatization

P. Mikula, J. Kulda, L. Horalík, B. Chalupa and P. Lukáš

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Reconciliation of valency ambiguity in V₂TiO₅ using XANES spectroscopy

S. Åsbrink, G. N. Greaves, P. D. Hatton and K. Garg

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An X-ray spectrometer for inelastic scattering experiments. I. Curved-crystal X-ray optics

P. Suortti, P. Pattison and W. Weyrich

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An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution

P. Suortti, P. Pattison and W. Weyrich

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An X-ray spectrometer for inelastic scattering experiments. III. Design and performance

P. Pattison, P. Suortti and W. Weyrich

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X-ray anomalous scattering difference patterns in qualitative and quantitative powder diffraction analysis

I. G. Wood, L. Nicholls and G. Brown

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A thermoelectric device for temperature-controlled single-crystal diffractometry

G. M. Fraase Storm and F. Tuinstra

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Phase transition at 555 K in nonlinear optic Pb₅Cr₃F₁₉

S. Arquis-Canouet, J. Ravez and S. C. Abrahams

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Improvement of the accuracy of HAUP, high-accuracy universal polarimeter: application to ferroelectric [N(CH₃)₄]ZnCl₄

J. Kobayashi, H. Kumomi and K. Saito

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Multi-site correlations and the atomic size effect

T. R. Welberry

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Mounting a 10 K cooling device without rotating seals on a four-circle diffractometer

K. Henriksen, F. K. Larsen and S. E. Rasmussen

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Structure study of amorphous lead titanate by the energy-dispersive X-ray diffraction method

H. Ozawa and R. Uno

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Oscillation camera data processing. 4. Results and recommendations for the processing of synchrotron radiation data in macromolecular crystallography

T. J. Greenhough and F. L. Suddath

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crystal data

Crystal data for D-methionine CH₃SCH₂CH₂CH(NH₂)COOH and D-tyrosine HOC₆H₄CH₂CH(NH₂)COOH

B. Khawas

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Crystal data for Sr₂Te₃O₈

Y. Elerman and M. Koçak

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Crystal data for 4-bromo-4'-fluorobiphenyl

F. Brown, J. N. Low and P. Tollin

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Crystal data for Mo_3.25Ir at 293 K and 12.5 K

R. Koksbang and S. E. Rasmussen

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computer program abstracts

PATMET – program for determination of orientation and position of a known fragment in the unit cell

C. C. Wilson and P. Tollin

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DREAM – data reduction and error analysis routines for accurate single-crystal diffraction intensity measurements

R. H. Blessing

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laboratory notes

Goniometer-head attachments for crystal characterization in Weissenberg or precession geometry

A. Okazaki and Y. Soejima

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Conversion of a high-temperature Guiner camera to a low-temperature device

S. E. Rasmussen and F. K. Larsen

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crystallographers

Crystallographers

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international union of crystallography

Commission on Journals - Authors grievance procedure

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new commercial products

New Commercial Products

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book reviews

Current topics in materials sceince. Vol. 11 edited by E. Kaldis

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Current topics in materials sceince. Vol. 12 edited by E. Kaldis

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