Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 19| Part 6

ISSN: 1600-5767

December 1986 issue

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research papers

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X-ray determination of the atomic displacements in NbC_0.72

M. Morinaga, K. Ohshima, J. Harada and S. Otani

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Rapid collection of X-ray powder data for pattern analysis by a cylindrical position-sensitive detector

S. Shishiguchi, I. Minato and H. Hashizume

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The small-angle neutron scattering spectrometer at the National Bureau of Standards

C. J. Glinka, J. M. Rowe and J. G. LaRock

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Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffraction data

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Crystal structure analysis of cytochrome c' by the multiwavelength anomalous diffraction method using synchrotron radiation

S. Harada, M. Yasui, K. Murakawa, N. Kasai and Y. Satow

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A conical-type X-ray guide tube for diffraction experiments with small crystals

H. Nozaki and H. Nakazawa

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A simple adjustable mount for a two-stage cryorefrigerator on an Eulerian cradle

J. M. Archer and M. S. Lehmann

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Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range

R. Delhez, Th. de Keijser, E. J. Mittemeijer and J. I. Langford

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Simultaneous measurement of several X-ray pole figures

J. J. Heizmann and C. Laruelle

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Diffraction pattern near the Bragg angle for an asymmetrically cut crystal

K. T. Kotsis and N. G. Alexandropoulos

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Observation of defects and the incommensurate phase in berlinite crystals by high-temperature X-ray topography

A. Zarka, B. Capelle, E. Philippot and J. C. Jumas

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short communications

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A new method for determination of the crystal setting matrix for interpreting oscillation photographs

R. Sarma, B. McKeever, R. Gallo and J. Scuderi

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An X-ray determination of the thermal expansion of α-phase Ag–Al alloys at high temperatures

S. K. Pradhan and M. De

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crystal data

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Crystal data for uranium phosphorus pentoxide, UPO₅, and uranium arsenic pentoxide, UAsO₅

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computer programs

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Use of a new array processor in the restrained least-squares procedure of Hendrickson and Konnert

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XFPS, a program for automatic Fourier, Patterson and superposition methods

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letters to the editor

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Errors in a recent critique of the Borie–Sparks method in diffuse scattering

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international union of crystallography

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Prices of Acta Crystallographica and Journal of Applied Crystallography

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