Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 20| Part 3

ISSN: 1600-5767

June 1987 issue

Highlighted illustration

research papers

link to html

Reflection electron microscopy

Read article

link to html

On the estimation of the unit-cell volume from powder diffraction data

Read article

link to html

Application of optimization to powder-pattern indexing

Read article

link to html

A powder diffractometer for a synchrotron source

Read article

link to html

The primitive function for slit-height desmearing in SAXS

M. Deutsch and M. Luban

Read article

link to html

Intensity expression for short-range-order diffuse scattering with ordering energies in a ternary alloy system

Read article

link to html

The distribution of carbon among interstitial sites of the f.c.c. iron-alloy lattice

Read article

link to html

Layer-disordered wurtzite (ZnS-2H): diffuse X-ray scattering recorded by c-axis precession photography

Read article

link to html

A high-pressure single-crystal X-ray diffraction study of V₃O₅ including the phase transition at 6.2 GPa

S. Åsbrink and M. Malinowski

Read article

link to html

Resolution corrections in diffuse scattering experiments

H. Boysen and W. Adlhart

Read article

link to html

Buerger precession camera and overall characterization of thin films and flat-plate crystals

J.-L. Staudenmann, R. D. Horning and R. D. Knox

Read article

link to html

Sensitivity of X-ray diffractometry for strain depth profiling in III–V heterostructures

S. Bensoussan, C. Malgrange and M. Sauvage-Simkin

Read article

link to html

X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga_1−xAl_xAs alloys

S. Bensoussan, C. Malgrange, M. Sauvage-Simkin, K. N'Guessan and P. Gibart

Read article

link to html

A system for collection and on-line integration of X-ray diffraction data from a multiwire area detector

M. Blum, P. Metcalf, S. C. Harrison and D. C. Wiley

Read article

link to html

A simple method of absorption and decay correction in intensities measured by area-detector X-ray diffractometer

Read article

link to html

A computer-based method of measuring the integrated intensities of the reflections on the X-ray diffraction photograph of an oriented crystalline polymer

I. H. Hall, J. Z. Neisser and M. Elder

Read article

short communications

link to html

Expressions for first and second derivatives in least-squares refinements including extinction

Read article

link to html

Lorentz–polarization factor for correction of diffraction-line profiles

Read article

link to html

Matrix formulation of the iterative method of phase analysis

M. Čerňanský

Read article

computer programs

link to html

An automated full-symmetry Patterson search method

J. Rius and C. Miravitlles

Read article

link to html

Computer derivation of the symmetry elements implied in a structure description

Read article

link to html

IMAGE, an interactive computer program for the visualization of molecular structures

C. Nayl, L. Lazzerini and M. Pierrot

Read article

crystallographers

link to html

Crystallographers

Read article

new commercial products

link to html

New Commercial Products

Read article

Kudos

News and jobs

Meetings

Follow J. Appl. Cryst.

Sign up for e-alerts

Follow J. Appl. Cryst. on Twitter

Follow us on facebook

Sign up for RSS feeds