Journal of Applied Crystallography
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Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 20
|
Part 4
ISSN: 1600-5767
August 1987 issue
research papers
J. Appl. Cryst.
(1987).
20
,
273-279
doi: 10.1107/S0021889887086679
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Resolution of time-of-flight small-angle neutron diffractometers
R. P. Hjelm Jnr
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J. Appl. Cryst.
(1987).
20
,
280-288
doi: 10.1107/S0021889887086667
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Optical transforms of disordered systems displaying diffuse intensity loci
T. R. Welberry
and
R. L. Withers
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J. Appl. Cryst.
(1987).
20
,
289-294
doi: 10.1107/S0021889887086655
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A method for checking X-ray diffractometer stability and its application
G. V. Fetisov
and
V. T. Markov
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J. Appl. Cryst.
(1987).
20
,
295-299
doi: 10.1107/S0021889887086643
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The information available from anomalous scattering on fibres at different wavelengths
C. Nave
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J. Appl. Cryst.
(1987).
20
,
300-305
doi: 10.1107/S0021889887086631
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The structure of Pt particles on γ-Al
2
O
3
support
M. Pan
,
J. M. Cowley
and
I. Y. Chan
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J. Appl. Cryst.
(1987).
20
,
306-315
doi: 10.1107/S002188988708662X
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Crystal orientation and X-ray pattern prediction routines for area-detector diffractometer systems in macromolecular crystallography
A. Messerschmidt
and
J. W. Pflugrath
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short communications
J. Appl. Cryst.
(1987).
20
,
316-319
doi: 10.1107/S0021889887086618
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The probabilistic determination of intensities of completely overlapping reflections in powder diffraction patterns
W. I. F. David
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J. Appl. Cryst.
(1987).
20
,
319-320
doi: 10.1107/S0021889887086606
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Cell volumes of LaPO
4
–CePO
4
solid solutions
R. S. de Biasi
,
A. A. R. Fernandes
and
J. C. S. Oliveira
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J. Appl. Cryst.
(1987).
20
,
320-322
doi: 10.1107/S002188988708659X
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Rietveld refinement of 3CaO.Al
2
O
3
.6H
2
O
Ľ. Smrčok
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crystal data
J. Appl. Cryst.
(1987).
20
,
323
doi: 10.1107/S0021889887086588
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Supporting information
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Crystal data for ternary compounds of the system Cu–As
2
Se
3
C. A. Majid
and
M. A. Hussain
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computer program abstracts
J. Appl. Cryst.
(1987).
20
,
324
doi: 10.1107/S0021889887086576
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EDDA
– program for predicting energy-dispersive powder diffraction spectra
L. Gerward
and
J. Staun Olsen
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crystallographers
J. Appl. Cryst.
(1987).
20
,
324-325
doi: 10.1107/S0021889887086564
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1987).
20
,
325
doi: 10.1107/S0021889887086552
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The Ewald Prize
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new commercial products
J. Appl. Cryst.
(1987).
20
,
325-326
doi: 10.1107/S0021889887086540
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