Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 20| Part 5

ISSN: 1600-5767

October 1987 issue

Highlighted illustration

research papers

link to html

SAXS study of the porous fractal structure of tricalcium silicate dry gels

A. F. Craievich

Read article

link to html

Angle calculations for a five-circle diffractometer used for surface X-ray diffraction

E. Vlieg, J. F. Van der Veen, J. E. Macdonald and M. Miller

Read article

link to html

Determination of the orientation of a randomly placed crystal from a single oscillation photograph

G. Vriend and M. G. Rossmann

Read article

link to html

Equi-lattice-spacing mapping X-ray topography

T. Ishikawa, T. Kitano and J. Matsui

Read article

link to html

X-ray scattering from a Troponin C solution and its interpretation with a dumbbell-shaped-molecule model

T. Fujisawa, T. Ueki, Y. Inoko and M. Kataoka

Read article

link to html

The use of the Durbin–Watson d statistic in Rietveld analysis

R. J. Hill and H. D. Flack

Read article

link to html

Solvent background subtraction for small-angle neutron scattering from samples in aqueous solution

Read article

link to html

Experiments with automated protein crystallization

M. J. Cox and P. C. Weber

Read article

link to html

Application of X-ray diffraction topography with a monochromatic divergent beam to the study of distorted crystals

M. Polcarová and J. Brádler

Read article

link to html

A diamond-anvil high-pressure cell for X-ray diffraction on a single crystal

Read article

link to html

The use of an imaging proportional counter in macromolecular crystallography

A. J. Howard, G. L. Gilliland, B. C. Finzel, T. L. Poulos, D. H. Ohlendorf and F. R. Salemme

Read article

link to html

A vector-averaging method for locating small differences between nearly identical protein structures

Read article

link to html

Refinement of simple crystal structures from synchrotron radiation powder diffraction data

G. Will, N. Masciocchi, W. Parrish and M. Hart

Read article

link to html

On the treatment of superimposed powder reflections: application to neutron diffraction analysis of membrane proteins

Read article

link to html

Synchrotron-radiation study of phase transitions in phosphorus at high pressures and temperatures

T. Kikegawa, H. Iwasaki, T. Fujimura, S. Endo, Y. Akahama, T. Akai, O. Shimomura, T. Yagi, S. Akimoto and I. Shirotani

Read article

link to html

Rietveld analysis of powder patterns obtained by TOF neutron diffraction using cold neutron sources

F. Izumi, H. Asano, H. Murata and N. Watanabe

Read article

link to html

Resolution of small-angle scattering with Soller collimation

D. F. R. Mildner and J. M. Carpenter

Read article

short communications

link to html

Determination of the crystal symmetry of two Al–Fe–Si phases by convergent-beam electron diffraction

P. Liu and G. L. Dunlop

Read article

link to html

Data averaging with normal down-weighting of outliers

R. H. Blessing and D. A. Langs

Read article

link to html

An experimental test of an elastically bent silicon crystal as a thermal-neutron monochromator

P. Mikula, P. Lukáš and R. Michalec

Read article

computer programs

link to html

Diffraction peak shapes: a profile refinement method for badly resolved powder diagrams

V. Tran and A. Buléon

Read article

link to html

CRYSRULER, an integrated system of computer programs for crystal structure analysis on personal computers

C. Rizzoli, V. Sangermano, G. Calestani and G. D. Andreetti

Read article

link to html

A computer program for the evaluation of orientation relationships from simple electron-diffraction spot patterns

Read article

link to html

A computer program for trace analyses in transmission electron microscopy

Read article

link to html

The multislice program for use on a PC-style desktop computer

D. F. Lynch and L. C. Qin

Read article

laboratory notes

link to html

A miniature Peltier-effect goniometer-head attachment

U. W. Arndt and S. J. Stubbings

Read article

computer program abstracts

link to html

EASY-REFINE, X-ray powder diffraction refinement program

J. L. Gautier, S. Zapata and J. Ortiz

Read article

crystallographers

link to html

Crystallographers

Read article

new commercial products

link to html

New Commercial Products

Read article

book reviews

link to html

Tunable solid-state lasers II edited by A. B. Budgor, L. Esterowitz and L. G. De Shazer

Read article

books received

link to html

Recent advances in X-ray characterisation of materials edited by P. Krishna

Read article

Kudos

News and jobs

Meetings

Follow J. Appl. Cryst.

Sign up for e-alerts

Follow J. Appl. Cryst. on Twitter

Follow us on facebook

Sign up for RSS feeds