Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 22
|
Part 3
ISSN: 1600-5767
June 1989 issue
research papers
J. Appl. Cryst.
(1989).
22
,
189-200
doi: 10.1107/S0021889888013342
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Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS
2
K. Z. Baba-Kishi
and
D. J. Dingley
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J. Appl. Cryst.
(1989).
22
,
201-204
doi: 10.1107/S0021889888013925
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The application of synchrotron radiation to X-ray multiple-diffraction studies
B. Brown
,
G. F. Clark
,
C. Dineen
,
B. J. Isherwood
,
E. Pantos
,
K. J. Roberts
and
T. Scheffen-Lauenroth
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J. Appl. Cryst.
(1989).
22
,
205-208
doi: 10.1107/S0021889888014025
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The influence of texture on the radial distribution function of solid carbons
Z. Kaszkur
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J. Appl. Cryst.
(1989).
22
,
209-215
doi: 10.1107/S0021889888014062
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A high-resolution diffuse X-ray scattering study of defects in dislocation-free silicon crystals grown by the float-zone method and comparison with Czochralski-grown crystals
K. Lal
and
G. Bhagavannarayana
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J. Appl. Cryst.
(1989).
22
,
216-221
doi: 10.1107/S0021889888014141
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On the selection of measurement directions in second-rank tensor (
e
.
g
. elastic strain) determination of single crystals
B. Ortner
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J. Appl. Cryst.
(1989).
22
,
222-230
doi: 10.1107/S0021889888014256
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Characterization of crystallites in carbon fibres by wide-angle X-ray diffraction
M. Shioya
and
A. Takaku
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J. Appl. Cryst.
(1989).
22
,
231-237
doi: 10.1107/S0021889888014281
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Distance information derived from neutron low–
Q
scattering
R. P. May
and
V. Nowotny
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J. Appl. Cryst.
(1989).
22
,
238-243
doi: 10.1107/S0021889888014487
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The use of direct convolution products in profile and pattern fitting algorithms. I. Development of algorithms
S. A. Howard
and
R. L. Snyder
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J. Appl. Cryst.
(1989).
22
,
244-251
doi: 10.1107/S0021889888014499
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The use of direct convolution products in profile and pattern fitting algorithms. II. Application of the algorithms
J. K. Yau
and
S. A. Howard
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J. Appl. Cryst.
(1989).
22
,
252-255
doi: 10.1107/S0021889888014736
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The effect of gravity on the resolution of small-angle neutron scattering
A. T. Boothroyd
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J. Appl. Cryst.
(1989).
22
,
256-260
doi: 10.1107/S002188988801430X
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The application of the Rietveld method to a highly strained material with microtwins: TiFeD
1.9
P. Thompson
,
J. J. Reilly
and
J. M. Hastings
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J. Appl. Cryst.
(1989).
22
,
261-268
doi: 10.1107/S0021889889000725
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Correction for preferred orientation in Rietveld refinement
M. Ahtee
,
M. Nurmela
,
P. Suortti
and
M. Järvinen
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J. Appl. Cryst.
(1989).
22
,
269-276
doi: 10.1107/S0021889888014773
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Determination of epitaxic-layer composition and thickness by double-crystal X-ray diffraction
I. C. Bassignana
and
C. C. Tan
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J. Appl. Cryst.
(1989).
22
,
277-282
doi: 10.1107/S0021889889001494
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High-resolution electron microscopy on incommensurate long-period superstructures of hexagonal-close-packed Cu–Sb alloy
T. Onozuka
,
S. Kakehashi
,
T. Takahashi
and
M. Hirabayashi
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short communications
J. Appl. Cryst.
(1989).
22
,
283-284
doi: 10.1107/S0021889888013937
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Thermal-expansion coefficients of yttria-stabilized cubic zirconias
S. P. Terblanche
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J. Appl. Cryst.
(1989).
22
,
284-286
doi: 10.1107/S0021889889000518
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Dramatic increase in ferritin crystal lifetime with monochromatic synchrotron X-radiation tuned to a wavelength above the iron
K
absorption edge
J. M. A. Smith
,
D. W. Rice
,
J. L. White
,
G. C. Ford
and
P. M. Harrison
Read article
computer programs
J. Appl. Cryst.
(1989).
22
,
287-293
doi: 10.1107/S0021889888014888
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LATTICEPATCH
– an interactive graphics program to design data measurement strategies for area detectors
A. L. Klinger
and
R. H. Kretsinger
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computer program abstracts
J. Appl. Cryst.
(1989).
22
,
294
doi: 10.1107/S0021889888014785
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CFFT
: a package of tools for Fourier analysis, written in C for UNIX machines
P. L. Bellon
and
S. Lanzavecchia
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J. Appl. Cryst.
(1989).
22
,
295
doi: 10.1107/S0021889889000506
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JOGGING
2 – a second version enabling the extraction of the absorption from the X-ray reflectivity spectra
B. Poumellec
and
R. Cortés
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J. Appl. Cryst.
(1989).
22
,
295-296
doi: 10.1107/S0021889889001627
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IMAP
– a program for manipulation and analysis of atomic positions for macromolecules using Tektronix compatible terminals
J. H. Everett
,
D. Groves
and
D. Prax
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crystallographers
J. Appl. Cryst.
(1989).
22
,
296-297
doi: 10.1107/S0021889889003936
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Free
Crystallographers
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new commercial products
J. Appl. Cryst.
(1989).
22
,
297-298
doi: 10.1107/S0021889889004000
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Free
New Commercial Products
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books received
J. Appl. Cryst.
(1989).
22
,
298
doi: 10.1107/S0021889889099772
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Free
Thermotropic liquid crystals. (Critical reports on applied chemistry,
Vol. 22.) edited by G. W. Gray
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