Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 22| Part 4

ISSN: 1600-5767

August 1989 issue

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research papers

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X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium

R. Kužel Jnr and P. Klimanek

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Diffraction from quasi-crystals and disordered twinned aggregates

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Modeling of Bragg intensity profiles. 1. Allowance for crystal mosaicity

A. V. Laktionov, A. I. Chulichkov, N. M. Chulichkova, G. V. Fetisov, Yu. P. Pyt'ev and L. A. Aslanov

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Electronically focused time-of-flight powder diffractometers at the intense pulsed neutron source

J. D. Jorgensen, J. Faber Jnr, J. M. Carpenter, R. K. Crawford, J. R. Haumann, R. L. Hitterman, R. Kleb, G. E. Ostrowski, F. J. Rotella and T. G. Worlton

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An X-ray monochromator system using successive reflection and its application to measurements of diffraction curves of annealed GaAs wafers

T. Fukumori and K. Futagami

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Crystallization of low-molecular-weight organic compounds for X-ray crystallography

P. van der Sluis, A. M. F. Hezemans and J. Kroon

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Stress distribution and lattice curvature determinations in multilayer structures by simulation of X-ray rocking curves

F. Cembali and M. Servidori

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Polarized neutron scattering by polarized protons of bovine serum albumin in deuterated solvent

W. Knop, H.-J. Schink, H. B. Stuhrmann, R. Wagner, M. Wenkow-Es-Souni, O. Schärpf, M. Krumpolc, T. O. Niinikoski, M. Rieubland and A. Rijllart

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The determination of crystal size and disorder from X-ray diffraction photographs of polymer fibres. 1. The accuracy of determination of Fourier coefficients of the intensity profile of a reflection

R. Somashekar, I. H. Hall and P. D. Carr

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X-ray diffractometry of AlGaAs/GaAs superlattices and GaAs in the temperature range 5–295 K

G. Clec'h, G. Calvarin, P. Auvray and M. Baudet

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short communications

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Some consideration of data corrections for a SAXS system employing a linear PSPC

H. Li and H. Chen

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Effect of stress from the glue on single-crystal X-ray intensities at high or low temperatures

R. Argoud and J. Muller

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High-pressure single-crystal X-ray diffraction studies of MoO₃. I. Lattice parameters up to 7.4 GPa. Erratum

S. Åsbrink, L. Kihlborg and M. Malinowski

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An X-ray determination of the thermal expansion of α-phase Cu–Si alloys at high temperature

S. K. Pradhan and M. De

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A measuring procedure for single-crystal diffraction using synchrotron radiation

M. Wendschuh-Josties and R. Wulf

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computer programs

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NRCVAX – an interactive program system for structure analysis

E. J. Gabe, Y. Le Page, J.-P. Charland, F. L. Lee and P. S. White

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RAD, a program for analysis of X-ray diffraction data from amorphous materials for personal computers

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SIR88 – a direct-methods program for the automatic solution of crystal structures

M. C. Burla, M. Camalli, G. Cascarano, C. Giacovazzo, G. Polidori, R. Spagna and D. Viterbo

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laboratory notes

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A procedure for the selection and transferring of crystals at low temperatures to diffractometers

R. Boese and D. Bläser

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A simple capillary-specimen attachment for parafocusing powder diffractometers

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computer program abstracts

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A simple capillary vapor diffusion apparatus for surveying macromolecular crystallization conditions

J. Luft and V. Cody

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DREADD – data reduction and error analysis for single-crystal diffractometer data

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LAUE – a program for high-precision orientation of crystals using the Laue method

G. Christiansen and L. Gerward

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crystallographers

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Crystallographers

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new commercial products

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New Commercial Products

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