Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 23| Part 4

ISSN: 1600-5767

August 1990 issue

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research papers

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A procedure for the generation of the symmetry of the multiple implication function from the crystal symmetry

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Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection

H.-G. Brühl, T. Baumbach, V. Gottschalch, U. Pietsch and B. Lengeler

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Factors affecting data reproducibility on an area detector

J. P. Rose and B.-C. Wang

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Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system

G. D. Wignall, J. S. Lin and S. Spooner

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Simultaneous structure and size–strain refinement by the Rietveld method

L. Lutterotti and P. Scardi

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Auto-indexing of oscillation images

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Time-resolved neutron diffraction analyses of hydrothermal syntheses using a novel autoclave cell

E. Polak, J. Munn, P. Barnes, S. E. Tarling and C. Ritter

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A new crystal growth form of vaterite, CaCO₃

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Anomalous small-angle X-ray scattering study of the early stages of decomposition in Cu–15wt%Ni–8wt%Sn

Ph. Goudeau, A. Naudon and J.-M. Welter

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Study of ferroelastic domains in HTMA crystals at the ferroelectric–ferroelastic transition

M. Ribet, S. Léon, F. Lefaucheux and M. C. Robert

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Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material

H. Toraya and M. Kitamura

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Lattice-parameter determination for powders using synchrotron radiation

M. Hart, R. J. Cernik, W. Parrish and H. Toraya

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A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system

R. J. Cernik, P. K. Murray, P. Pattison and A. N. Fitch

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An automated system for micro-batch protein crystallization and screening

N. E. Chayen, P. D. Shaw Stewart, D. L. Maeder and D. M. Blow

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Optical transforms of disordered systems containing symmetry-related scattering sites

T. R. Welberry and R. L. Withers

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Quantitative X-ray powder diffraction analysis applied to transmission diffraction

B. L. Davis and M. N. Spilde

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Analytical treatment of the resolution function for small-angle scattering

J. S. Pedersen, D. Posselt and K. Mortensen

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An automatic diffraction data collection system with an imaging plate

I. Tanaka, M. Yao, M. Suzuki, K. Hikichi, T. Matsumoto, M. Kozasa and C. Katayama

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short communications

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Low-temperature X-ray diffraction examination of In₂Se₃

B. Gržeta, S. Popović, N. Cowlam and B. Čelustka

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A convenient translation-function parameterization

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computer programs

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Calculation of small-angle scattering profiles using Monte Carlo simulation

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TEXCAM – an interpretation aid for cylindrical texture camera X-ray diffraction patterns

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crystallographers

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Crystallographers

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new commercial products

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New Commercial Products

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