Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 23| Part 5

ISSN: 1600-5767

October 1990 issue

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research papers

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A high-resolution Weissenberg camera for X-ray synchrotron radiation

D. Hohlwein and J. D. Axe

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Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates

I. R. Entin, V. I. Khrupa and L. I. Datsenko

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A fitting method for the determination of crystallinity by means of X-ray diffraction

S. Polizzi, G. Fagherazzi, A. Benedetti, M. Battagliarin and T. Asano

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The internal structure of layered colloidal particles determined with SANS

M. H. G. Duits, R. P. May and C. G. de Kruif

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The rotation rate field and geometry of orientation space

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Improvements to the Chebyshev expansion of attenuation correction factors for cylindrical samples

D. F. R. Mildner and J. M. Carpenter

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Mounting of crystals for macromolecular crystallography in a free-standing thin film

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The effect of diffraction by the diamonds of a diamond-anvil cell on single-crystal sample intensities

J. S. Loveday, M. I. McMahon and R. J. Nelmes

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High-pressure single-crystal study on AlPO₄ with synchrotron radiation

H. Sowa, K. Reithmayer, J. Macavei, W. Rieck, H. Schulz and V. Kupčik

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Small-angle X-ray scattering at high energies

D. P. Siddons, C. Riekel and J. B. Hastings

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A robust alternative to η refinement for assessing the hand of chiral compounds

Y. Le Page, E. J. Gabe and G. J. Gainsford

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Characteristic X-ray flux from sealed Cr, Cu, Mo, Ag and W tubes

V. Honkimäki, J. Sleight and P. Suortti

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Structural study of Cd(S,Se) doped glasses. High-resolution transmission electron microscopy (HRTEM) assisted by image processing

M. Allais and M. Gandais

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Characterization of a chromia–alumina catalyst using small-angle neutron scattering

D. R. Acharya, T. L. Crowley, R. Hughes, C. L. Koon, M. Menendez and F. Rieutord

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short communications

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Absolute polarity of α-lithium iodate. Erratum

S. C. Abrahams, R. Liminga and J. Albertsson

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Silicon photodiode detector for small-angle X-ray scattering

P. R. Jemian and G. G. Long

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Modernization of the Philips PW1100 single-crystal diffractometer computer control system

M. W. Grigg and Z. Barnea

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computer programs

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PAP: a protein analysis package

T. Callahan, W. B. Gleason and T. P. Lybrand

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ABSCOR: a scaling and absorption correction program for the FAST area detector diffractometer

A. Messerschmidt, M. Schneider and R. Huber

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BIRCH, a program for fitting PV data to an Eulerian finite-strain equation of state

C. R. Ross II and S. L. Webb

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fast communications

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Sub-nanosecond X-ray powder diffraction

N. C. Woolsey, J. S. Wark and D. Riley

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computer program abstracts

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PROFAN-PC: a PC program for powder peak profile analysis

P. Merz, E. Jansen, W. Schäfer and G. Will

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crystallographers

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Crystallographers

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notes and news

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The Dorothy Hodgkin Prize of the British Crystallographic Association

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new commercial products

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New Commercial Products

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