Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 24| Part 1

ISSN: 1600-5767

February 1991 issue

Highlighted illustration

research papers

link to html

E.s.d.'s and estimated probable error obtained in Rietveld refinements with local correlations

J.-F. Bérar and P. Lelann

Read article

link to html

Localization of impurity atoms in garnet cystals by the double-channel X-ray standing-wave method

E. Kh. Mukhamedzhanov, A. V. Maslov, R. M. Imamov, A. A. Bzhaumikhov, E. A. Fedorov and S. A. Kobzareva

Read article

link to html

Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement

J. C. Taylor and C. E. Matulis

Read article

link to html

The rôle of phase in diffuse diffraction patterns and its effect on real-space structure

T. R. Welberry and R. L. Withers

Read article

link to html

High-resolution small-angle X-ray scattering camera for anomalous scattering

G. G. Long, P. R. Jemian, J. R. Weertman, D. R. Black, H. E. Burdette and R. Spal

Read article

link to html

A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns: application to zincblende-type structures

K. Z. Baba-Kishi

Read article

link to html

The application of synchrotron X-radiation for the study of phase transitions in lipid model membrane systems

L. J. Lis and P. J. Quinn

Read article

short communications

link to html

A multimode high-angular-resolution powder diffractometer

M. Kurahashi, K. Honda, M. Goto, Y. Inari and C. Katayama

Read article

link to html

Absolute structures: is your diffractometer right-handed?

Y. Le Page and E. J. Gabe

Read article

computer programs

link to html

Visualization software for X-ray diffraction data from area detectors

D. H. Ohlendorf

Read article

link to html

Restrained refinement and results analysis for incommensurate crystal structures

W. A. Paciorek, G. Madariaga and F. J. Zúñiga

Read article

link to html

POWABS: a computer program for the automatic determination of reflection conditions in powder diffraction patterns

P. G. Byrom and B. W. Lucas

Read article

laboratory notes

link to html

A simple densitometer for X-ray powder photographs

N. J. Calos and C. H. L. Kennard

Read article

link to html

Use of a Hewlett-Packard ScanJet image digitizer as an X-ray powder photograph densitometer

N. J. Calos and C. H. L. Kennard

Read article

fast communications

link to html

The influence of laser radiation on X-ray diffraction in ferroelectric crystals with nonlinear optical properties

S. G. Zhukov, G. V. Fetisov and L. A. Aslanov

Read article

crystallographers

link to html

Crystallographers

Read article

new commercial products

link to html

New Commercial Products

Read article

Kudos

News and jobs

Meetings

Follow J. Appl. Cryst.

Sign up for e-alerts

Follow J. Appl. Cryst. on Twitter

Follow us on facebook

Sign up for RSS feeds