Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 23| Part 6

ISSN: 1600-5767

December 1990 issue

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research papers

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Crystals and composites

R. E. Newnham and S. Trolier-McKinstry

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X-ray diffuse scattering of a decomposing hexagonal alloy

R. I. Barabash, S. A. Demin, M. A. Krivoglaz and K. V. Chuistov

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Profile agreement indices in Rietveld and pattern-fitting analysis

R. J. Hill and R. X. Fischer

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Estimation of incoherent backgrounds in SANS studies of polymers

W. S. Dubner, J. M. Schultz and G. D. Wignall

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A position-sensitive detector system for the measurement of diffuse X-ray scattering

J. C. Osborn and T. R. Welberry

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Array-type universal profile function for powder pattern fitting

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Coefficients of molecular homeomorphism and crystalline isomorphism in the series of 2-R-naphthalene (R = H, F, Cl, CH₃, SH, Br)

Y. Haget, L. Bonpunt, F. Michaud, P. Negrier, M. A. Cuevas-Diarte and H. A. J. Oonk

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Short-range-order determination in quenched NbC_0.73 by elastic diffuse neutron scattering

B. Beuneu, T. Priem, C. H. de Novion, S. Lefebvre, J. Chevrier and A. N. Christensen

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Time-resolved two-dimensional observation of the change in X-ray diffuse scattering from an alloy single crystal using an imaging plate on a synchrotron-radiation source

H. Iwasaki, Y. Matsuo, K. Ohshima and S. Hashimoto

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The pressure-induced transformation B1 to B2 in actinide compounds

L. Gerward, J. S. Olsen, S. Steenstrup, U. Benedict and S. Dabos-Seignon

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Structure determination of LiMoP₂O₇ from multiphase powder X-ray diffraction data

S. L. Wang, P. C. Wang and Y. P. Nieh

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Electron-density distribution from X-ray powder data by use of profile fits and the maximum-entropy method

M. Sakata, R. Mori, S. Kumazawza, M. Takata and H. Toraya

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Small-angle-scattering determination of the microstructure of porous silica precursor bodies

G. G. Long, S. Krueger, P. R. Jemian, D. R. Black, H. E. Burdette, J. P. Cline and R. A. Gerhardt

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short communications

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A furnace for in situ synchrotron Laue diffraction and its application to studies of solid-state phase transformations

H. L. Bhat, S. M. Clark, A. El Korashy and K. J. Roberts

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computer programs

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Automatic evaluation of general spot profiles in oscillation photography

S. Chakravarty and K. K. Kannan

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MXD: a general least-squares program for non-standard crystallographic refinements

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computer program abstracts

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SYMABS – an interactive program for checking systematic absences caused by lattice centering, glide planes and screw axes

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ANGSORT – an interactive program for determination of strong high-angle reflections for the determination of precise lattice constants

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crystallographers

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Crystallographers

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international union of crystallography

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Prices of Acta Crystallographica and Journal of Applied Crystallography

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