Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 26| Part 1

ISSN: 1600-5767

February 1993 issue

research papers

A 10⁹ high-pressure cell for X-ray and optical measurements

M. Leszczynski, S. Podlasin and T. Suski

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On the least-squares determination of lattice dimensions: a modified singular value decomposition approach to ill-conditioned cases

U. Anselmi-Tamburini and G. Spinolo

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A data-acquisition system for area detectors

B. P. Schoenborn, H. Wang, M. A. Kelley, G. Dimmler and S. Rankowitz

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Patterson-map interpretation with noncrystallographic symmetry

L. Tong and M. G. Rossmann

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The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide

J. I. Langford, A. Boultif, J. P. Auffrédic and D. Louër

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Grazing-incidence X-ray diffraction on ion-implanted silicon

S. Rugel, G. Wallner, H. Metzger and J. Peisl

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Effect of variation in PbI₂ doping on the polytypism of dendritic CdI₂ single crystals

B. Kumar and G. C. Trigunayat

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Quality control of protein models: directional atomic contact analysis

G. Vriend and C. Sander

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A new neutron diffractometer with multiple detectors combining the advantages of time-of-flight and double-axis diffractometers

W. Turba, T. Peterlin-Neumaier and E. Steichele

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Protein symmetry: metric and crystal (a precautionary note)

A. D. Mighell, J. R. Rodgers and V. L. Karen

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Twinning of LaGaO₃ single crystals

I. K. Bdikin, I. M. Shmyt'ko, A. M. Balbashov and A. V. Kazansky

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High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position

N. E. Brown, S. M. Swapp, C. L. Bennett and A. Navrotsky

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Computer processing and analysis of X-ray fibre diffraction data

M. Lorenz and K. C. Holmes

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Preparation of protein crystallization buffers with a computer-controlled motorized pipette: PIPEX

J.-L. Eiselé

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Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

D. Balzar and H. Ledbetter

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One-dimensional contrast modulations in [001] high-resolution reverse images of Bi₂Sr₂(Ca_1−xNd_x)Cu₂O_8+δ ceramics

T. Onozuka

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Towards statistics of crystal orientations in quantitative texture anaylsis

H. Schaeben

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Study of Brazil twin boundaries in synthetic quartz by means of simulations of X-ray topographs

M. González-Mañas, M. A. Caballero, B. Capelle and Y. Epelboin

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short communications

Modeling of line-shape asymmetry in powder diffraction

J.-F. Bérar and G. Baldinozzi

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The use of soft X-rays of very long wavelengths for small-angle scattering at the Aladdin storage ring

J. S. Tse, D. D. Klug and B. X. Yang

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Microabsorption of scattered X-rays and its dependence on incidence angle in the nonsymmetric reflection case

W. Pitschke, H. Hermann and N. Mattern

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Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber

J. Ihringer and A. Küster

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computer programs

POLISH: computer program for improving the accuracy of structure-factor magnitudes obtained from powder data

P. G. Byrom and B. W. Lucas

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DIFK91: a program for the modelling of powder diffraction patterns on a PC

Ľ. Smrčok and Z. Weiss

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letters to the editor

Hazards of oblique coordinate systems: a reminder

K. W. Muir and P. R. Mallinson

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computer program abstracts

XTALLAB and POWDER – computer assisted instruction in elementary crystallographic methods

C. L. Day and R. A. Jacobson

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crystallographers

Crystallographers

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new commercial products

New Commercial Products

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book reviews

Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart

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international union of crystallography

Journal of Applied Crystallography. Notes for Authors

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