Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 26
|
Part 2
ISSN: 1600-5767
April 1993 issue
research papers
J. Appl. Cryst.
(1993).
26
,
151-158
doi: 10.1107/S0021889892010239
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A new technique for the observation of X-ray CTR scattering by using an imaging plate detector
T. Shimura
and
J. Harada
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J. Appl. Cryst.
(1993).
26
,
159-165
doi: 10.1107/S0021889892010793
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Maximum-entropy-method analysis of neutron diffraction data
M. Sakata
,
T. Uno
,
M. Takata
and
C. J. Howard
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J. Appl. Cryst.
(1993).
26
,
166-171
doi: 10.1107/S0021889892011592
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A method for the accurate determination of crystal truncation rod intensities by X-ray diffraction
E. D. Specht
and
F. J. Walker
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J. Appl. Cryst.
(1993).
26
,
172-179
doi: 10.1107/S0021889892009038
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A four-point crystal bender for dispersive X-ray absorption spectroscopy
P. G. Allen
,
S. D. Conradson
and
J. E. Penner-Hahn
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J. Appl. Cryst.
(1993).
26
,
180-184
doi: 10.1107/S0021889892009762
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X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard
T. C. Huang
,
H. Toraya
,
T. N. Blanton
and
Y. Wu
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J. Appl. Cryst.
(1993).
26
,
185-191
doi: 10.1107/S0021889892009956
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X-ray diffraction studies of annealed Czochralski-grown silicon. I. Double-crystal diffractometry
S. Joksch
,
P. Zaumseil
and
W. Zulehner
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J. Appl. Cryst.
(1993).
26
,
192-197
doi: 10.1107/S002188989201001X
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X-ray diffracton studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry
P. Zaumseil
,
S. Joksch
and
W. Zulehner
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J. Appl. Cryst.
(1993).
26
,
198-206
doi: 10.1107/S0021889892010069
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Measurement of the radii of gyration of ribosomal components
in situ
by neutron scattering
D. H. Harrison
,
R. P. May
and
P. B. Moore
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J. Appl. Cryst.
(1993).
26
,
207-213
doi: 10.1107/S0021889892010136
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Determination of the total texture function from individual orientations modelled by a Lorentzian distribution
T. Baudin
and
R. Penelle
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J. Appl. Cryst.
(1993).
26
,
214-218
doi: 10.1107/S0021889892010392
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The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method: the influence of additive penetration into the solute particles
T. Kawaguchi
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J. Appl. Cryst.
(1993).
26
,
219-225
doi: 10.1107/S0021889892010422
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X-ray reconstruction topography for observation of the orientation distribution in a single crystal
Y. Chikaura
and
Y. Suzuki
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J. Appl. Cryst.
(1993).
26
,
226-228
doi: 10.1107/S0021889892010677
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The use of carbon-composite cryostat chambers in low-temperature X-ray diffraction
D. D. Coppens
,
P. Coppens
,
R. Li
and
P. Lee
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J. Appl. Cryst.
(1993).
26
,
229-242
doi: 10.1107/S0021889892010987
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On the morphology of normal alkane crystals with monoclinic structures: theory and observations
X. Y. Liu
and
P. Bennema
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J. Appl. Cryst.
(1993).
26
,
243-250
doi: 10.1107/S0021889892011130
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Study of defects and structure in organic crystals of potassium hydrogen phthalate
Q. L. Zhao
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J. Appl. Cryst.
(1993).
26
,
251-257
doi: 10.1107/S0021889892011750
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Neutron diffraction in flat and bent mosaic crystals for asymmetric geometry
H.-C. Hu
and
Y. Fang
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J. Appl. Cryst.
(1993).
26
,
258-267
doi: 10.1107/S0021889892011828
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A direct indirect method of small-angle scattering data treatment
D. I. Svergun
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J. Appl. Cryst.
(1993).
26
,
268-271
doi: 10.1107/S002188989201149X
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Estimation of the true orientation distribution function determination of the maximum-entropy method by the Taylor model
Y. Liu
,
F. Wang
,
J. Xu
and
Z. Liang
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J. Appl. Cryst.
(1993).
26
,
272-276
doi: 10.1107/S0021889892011610
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On a small error in SRM640, SRM640a and SRM640b lattice parameters
D. Yoder-Short
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short communications
J. Appl. Cryst.
(1993).
26
,
277-280
doi: 10.1107/S0021889892010665
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Indexing unit cells from synchrotron X-ray powder diffraction data
R. J. Cernik
and
D. Louër
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J. Appl. Cryst.
(1993).
26
,
280-283
doi: 10.1107/S0021889892011282
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The lattice constant of a nonperfect crystal measured by X-ray diffraction
M. Leszczynski
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computer programs
J. Appl. Cryst.
(1993).
26
,
283-291
doi: 10.1107/S0021889892009944
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PROCHECK
: a program to check the stereochemical quality of protein structures
R. A. Laskowski
,
M. W. MacArthur
,
D. S. Moss
and
J. M. Thornton
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J. Appl. Cryst.
(1993).
26
,
291-294
doi: 10.1107/S0021889892009282
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The FROG PC series: programs for electron-density and model investigations for proteins
E. A. Vernoslova
and
V. Yu. Lunin
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J. Appl. Cryst.
(1993).
26
,
295-302
doi: 10.1107/S0021889892010495
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PEDX
: a program for radial-distribution-function analysis of energy-dispersive X-ray diffraction data from disordered systems
V. Petkov
and
Y. Waseda
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J. Appl. Cryst.
(1993).
26
,
302-304
doi: 10.1107/S0021889892011749
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An effective algorithm for calculation of the Clebsch–Gordan coefficients
L. Zuo
,
M. Humbert
and
C. Esling
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laboratory notes
J. Appl. Cryst.
(1993).
26
,
305-306
doi: 10.1107/S0021889892011920
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A yokeless flow cell for Laue crystallography
S. L. Edwards
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letters to the editor
J. Appl. Cryst.
(1993).
26
,
307
doi: 10.1107/S002188989201241X
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The use of alternative filaments for the Rigaku RU 200 X-ray generator
R. Leidich
and
V. Bernal
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computer program abstracts
J. Appl. Cryst.
(1993).
26
,
308
doi: 10.1107/S002188989200921X
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CPSR
– an integrated software package of menu-driven computer programs for X-ray powder-pattern refinement
Yu. G. Andreev
,
N. I. Sorokin
and
A. K. Churakov
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new commercial products
J. Appl. Cryst.
(1993).
26
,
308
doi: 10.1107/S0021889893099649
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New Commercial Products
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