Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 26| Part 4

ISSN: 1600-5767

August 1993 issue

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research papers

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Equations for diffuse scattering from pseudobinary sphalerite F $\overline{4}$ 3m systems

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Indirect transformation in reciprocal space: desmearing of small-angle scattering data from partially ordered systems

O. Glatter and K. Gruber

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Fractal neutron optics multilayers in Cantor ternary set pattern

M. Mâaza, B. Pardo and T. Megademini

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Application of symmetrized harmonics expansion to correction of the preferred orientation effect

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Influence of misoriented substrates and dislocations on the diffraction patterns of superlattices

B. Rosner and H. Berger

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Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

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Relation between the optical properties and structure of KLiSO₄ in the room-temperature phase

J. Ortega, J. Etxebarria and T. Breczewski

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The absolute optical chirality of KLiSO₄

K. Stadnicka, A. M. Glazer and S. Arzt

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ASTEC: an automated system for sitting-drop protein crystallization

T. M. B. Soriano and J. C. Fontecilla-Camps

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Potential of the INEL X-ray position-sensitive detector: a general study of the Debye–Scherrer setting

M. Evain, P. Deniard, A. Jouanneaux and R. Brec

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Twinning study of CdTe epitaxic layer by X-ray ι-scan measurement

C. Brizard, G. Rolland and F. Laugier

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Reduction of the interfacial diffusion in Ni–Ti neutron-optics multilayers by carburation of the Ni–Ti interfaces

M. Mâaza, B. Farnoux, F. Samuel, C. Sella, F. Wehling, F. Bridou, M. Groos, B. Pardo and G. Foulet

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The determination of unit-cell parameters from Bragg reflection data using a standard reference material but without a calibration curve

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Possible improvements in the precision and accuracy of small-angle X-ray scattering measurements

M. Steinhart and J. Pleštic

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Debye temperature and mean-square amplitudes of vibration of Ti₃ Al alloys

H. D. Shashikala, S. V. Suryanarayana and S. V. Nagender Naidu

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Relationship between symmetry and estimates of the volume of the unit cell in a powder diffraction pattern

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short communications

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On the shape of the radial distribution function of an assembly of monodisperse ellipsoidal scatterers

E. Caponetti, M. A. Floriano, E. Di Dio and R. Triolo

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Crystal handling at low temperatures

T. Kottke and D. Stalke

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A 10⁹ Pa high-pressure cell for X-ray and optical measurements. Erratum

M. Leszczynski, S. Podlasin and T. Suski

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computer programs

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CELLX – an interactive program for the display of unit cells and reciprocal space

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TLSANL: TLS parameter-analysis program for segmented anisotropic refinement of macromolecular structures

B. Howlin, S. A. Butler, D. S. Moss, G. W. Harris and H. P. C. Driessen

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new commercial products

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New Commercial Products

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book reviews

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Inorganic materials edited by D. W. Bruce and D. O'Hare

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books received

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Crystallography in modern chemistry. A resource book of crystal structures by T. C. W. Mak and G.-D. Zhou

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Proton conductors - solids, membranes and gels - materials and devices edited by P. Colomban

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