Journal of Applied Crystallography Journal of Applied
Crystallography

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issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 27| Part 5

ISSN: 1600-5767

October 1994 issue

Highlighted illustration

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers

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Synthesizing and fitting linear position-sensitive detector step-scanned line profiles

R. W. Cheary and A. Coelho

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Aggregation in aluminium hydroxide solutions investigated by small-angle X-ray scattering

S. S. Kumru and H. D. Bale

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The effect of the shape function on small-angle scattering analysis by the maximum-entropy method

P. R. Jemian and A. J. Allen

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A new method of highly accurate orientation of single crystals on a standard powder diffractometer

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Observations on growth of NaCl crystals out of the surface of sodalite [Na₈(Al₆Si₆O₂₄)Cl₂]

A. M. Hassib and H. Annersten

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Step size, scanning speed and shape of X-ray diffraction peak

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Refinement of hexamethylenetetramine based on diffractometer and imaging-plate data

J. Grochowski, P. Serda, K. S. Wilson and Z. Dauter

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Apparatus for the measurement of the electronic excited-state structure of single crystals using X-ray diffraction

M. A. White, M. R. Pressprich, P. Coppens and D. D. Coppens

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Diffuse X-ray scattering in potassium lithium sulfate, KLiSO₄

T. R. Welberry and A. M. Glazer

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Analysis of diffuse scattering from the mineral mullite

B. D. Butler and T. R. Welberry

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A simple method for determining orientation and misorientation of the cubic crystal specimen

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A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy

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In-plane lattice-parameter and crystallite-size determination in a turbostratic graphite-like structure

Yu. G. Andreev and T. Lunström

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Computer simulation of local atomic displacements in alloys. Application to Guinier–Preston zones in Al–Cu

J. Kyobu, Y. Murata and M. Morinaga

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Scaling functions for the finite-size effect in fractal aggregates

Y. Zang and S. Meriani

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An optimal strategy for X-ray data collection on macromolecular crystals with position-sensitive detectors

I. Vicković, K. H. Kalk, J. Drenth and B. W. Dijkstra

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Estimation of single-crystal elastic constants from textured polycrystal measurements

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International Union of Crystallography. Commission on Powder Diffraction. Rietveld refinement round robin. II. Analysis of monoclinic ZrO₂

R. J. Hill and L. M. D. Cranswick

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short communications

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DIFFUSE: a procedure to measure diffuse intensity on a CAD-4 diffractometer with CAD-4-EXPRESS software

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computer programs

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Development of the computational procedures for simulation and indexing of back-reflection Laue patterns

C. Marín, A. Cintas and E. Diéguez

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laboratory notes

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A rapid method to assess X-ray area detectors by oriented protein crystal diffraction

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fast communications

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Geometrical limits and improvement of the diffraction optics in Gandolfi cameras

M. Gregorkiewitz

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computer program abstracts

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PATGEN – an automatic program to generate theoretical Patterson peaks and to compare them with experimental Patterson peaks

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PAUTO – an automatic procedure for crystal structure solution by the Patterson method in the CAOS package

M. Camalli and R. Spagna

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crystallographers

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Crystallographers

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new commercial products

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New Commercial Products

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