journal menu
addenda and errata
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
Robust surface structure analysis with reliable uncertainty estimation using the exchange Monte Carlo method. Corrigendum
aGraduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan, bGraduate School of Arts and Sciences, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan, cKomaba Institute for Science, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan, dPrecursory Research for Embryonic Science and Technology, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan, eGraduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan, and fGraduate School of Science, Tohoku University, 6-3, Aramaki Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan
*Correspondence e-mail: wakabayashi@tohoku.ac.jp
An error in the article by Nagai, Anada, Nakanishi-Ohno, Okada & Wakabayashi [J. Appl. Cryst. (2020), 53, 387–392] is corrected.
Keywords: surface diffraction; Bayesian inference; Monte Carlo; oxide films; epitaxial films.
Equation (11) in the article by Nagai et al. (2020![[Nagai, K., Anada, M., Nakanishi-Ohno, Y., Okada, M. & Wakabayashi, Y. (2020). J. Appl. Cryst. 53, 387-392.]](../../../../../../logos/arrows/j_arr.gif "Nagai, K., Anada, M., Nakanishi-Ohno, Y., Okada, M. & Wakabayashi, Y. (2020). J. Appl. Cryst. 53, 387-392.")
) should read
![[C_{\rm E}(j) = {{\sum _{i}\Delta({\bf Q}_{i})\Delta({\bf Q}_{{i+j}})} \over {\sum _{i}[\Delta({\bf Q}_{i})]^{2}}}.]](teximages/to9205fd1.svg)
The inset of Fig. 6 was calculated with the correct equation, and therefore no change is needed in the rest of the paper.
References
Nagai, K., Anada, M., Nakanishi-Ohno, Y., Okada, M. & Wakabayashi, Y. (2020). J. Appl. Cryst. 53, 387–392. Web of Science CrossRef CAS IUCr Journals Google Scholar
© International Union of Crystallography. Prior permission is not required to reproduce short quotations, tables and figures from this article, provided the original authors and source are cited. For more information, click here.
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
