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Figure 8
Comparison of detection methods in diffractograms. (a) and (e) One-dimensional radially averaged profiles of diffractograms calculated from center locations obtained by all detection methods (manual = three-point detection, phase = phase cross-correlation, ccorr = autocorrelation, intensity = maximum intensity detection, curvefit = pseudo-Voigt profile fitting and hough = Hough transform; methods with an `-s' suffix were applied to edge-detected diffractograms). (b) and (f) Close-up views of the most intense diffraction peak [highlighted by the red rectangle in panels (a) and (e), respectively], illustrating how inaccuracies in center location affect the peak's intensity, location and shape. (c) and (g) Diffractograms with detected center locations. (d) and (h) Close-up views of the detected center positions. The samples consisted of (top row) Fe3O4 nanoclusters with an organic shell using 4D-STEM-in-SEM and (bottom row) Au nanoclusters.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 845-857
https://doi.org/10.1107/S1600576726002384
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