An X-ray method for the determination of domain size from the tails of diffraction profiles

The paper describes a method for obtaining consistent estimates of domain size from an evaluation of coefficients derived from curves fitted to the tails of diffraction profiles. An estimate of the mean domain size is computed directly from the intensity data and this is equivalent to the value derived from the slope of the variance-range function. For many applications this provides a convenient alternative to the method described by Langford & Wilson (Crystallography and Crystal Perfection. London: Academic Press, 1963) but does not replace it. An advantage of the present method is its simplicity and consequent reduction in computing time. It is easier to apply if a computer is not available and is applicable in cases where one or other of the profile tails overlaps that of a neighbouring line. The results obtained by this method are comparable in accuracy to those given by existing techniques.