A thermoelectric device for temperature-controlled single-crystal diffractometry

Fraase Storm, G.M.; Tuinstra, F.

doi:10.1107/S0021889886089215

A thermoelectric device for temperature-controlled single-crystal diffractometry

A device for X-ray diffraction in the range from 250 to 350 K is presented. The device is so small and light that it can be mounted on an X YZ head. Temperature fluctuations and gradient in the sample chamber are less than 0.2 K and 0.3 K mm^-1.

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A thermoelectric device for temperature-controlled single-crystal diffractometry

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