Buy article online - an online subscription or single-article purchase is required to access this article.
A rotating glass capillary cell with a gas handling system has been built to allow in situ studies by powder X-ray diffraction. The cell can be used to condense volatile compounds, or to follow solid-state chemical reactions under vacuum or at gas pressures up to around 7 × 105 Pa. Using the cell, cooled by a stream of helium gas, the solid phases of 1,2-dichlorotrifluoroethane (HCFC-123a) and 2-chloro-1,1,1,2-tetrafluoroethane (HCFC-124) have been investigated using powder synchrotron X-ray radiation. These were found to have disordered hexagonal structures, with a = 4.018 (5), c = 6.553 (1) Å and a = 4.048 (1), c = 6.625 (1) Å, respectively, at 64 K.
Supporting information
CCDC reference: 209201
Crystal data top
| C2HCl2F3 | Z = ? |
| Mr = 152.93 | Melting point: 78 K |
| Hexagonal, P63/mmc | Synchrotron radiation, λ = 0.401340 Å |
| a = 4.000 Å | T = 60 K |
| c = 6.523 Å | × × mm |
| V = 90.37 Å3 | |
Crystal data top
| C2HCl2F3 | V = 90.37 Å3 |
| Mr = 152.93 | Z = ? |
| Hexagonal, P63/mmc | Synchrotron radiation, λ = 0.401340 Å |
| a = 4.000 Å | T = 60 K |
| c = 6.523 Å | × × mm |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top| | x | y | z | Biso*/Beq | |
| C | −0.14036 | 0.39482 | 0.04282 | 3.00* | |
| C | 0.29145 | 0.69269 | 0.04592 | 3.00* | |
| Cl | −0.34393 | 0.41134 | −0.19441 | 3.00* | |
| Cl | 0.49659 | 0.68285 | 0.28375 | 3.00* | |
| F | −0.31455 | 0.47429 | 0.19040 | 3.00* | |
| F | −0.19820 | 0.04516 | 0.07190 | 3.00* | |
| F | 0.46472 | 0.60928 | −0.10377 | 3.00* | |
| H | 0.33420 | 0.97862 | 0.02355 | 6.00* | |
Experimental details
| Crystal data |
| Chemical formula | C2HCl2F3 |
| Mr | 152.93 |
| Crystal system, space group | Hexagonal, P63/mmc |
| Temperature (K) | 60 |
| a, c (Å) | 4.000, 6.523 |
| V (Å3) | 90.37 |
| Z | ? |
| Radiation type | Synchrotron, λ = 0.401340 Å |
| µ (mm−1) | ? |
| Crystal size (mm) | × × |
| |
| Data collection |
| Diffractometer | ? |
| Absorption correction | ? |
No. of measured, independent and observed (?) reflections | ?, ?, ? |
| Rint | ? |
| |
| Refinement |
| R[F2 > 2σ(F2)], wR(F2), S | ?, ?, 2.90 |
| No. of reflections | ? |
| No. of parameters | ? |
| No. of restraints | ? |
| Δρmax, Δρmin (e Å−3) | ?, ? |

Subscribe to Journal of Synchrotron Radiation
The full text of this article is available to subscribers to the journal.
If you have already registered and are using a computer listed in your registration details, please email
[email protected] for assistance.