Determination of d_min and λ_min from the Intensity Distributions of Laue Patterns

The parameters d_min and λ_min, essential for the processing of synchrotron X-ray Laue patterns, can be efficiently estimated by examination of the distribution of measured intensities as a function of d spacing and wavelength, respectively. A procedure that can be carried out automatically as one step in the data processing has been tested with Laue data sets from an organometallic compound and two proteins.