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A technique for the measurement of diffuse X-ray scattering on individual reciprocal-space planes using high-energy X-ray photons is described. The method is demonstrated using a disordered crystal of the compound TlSbOGeO4 and compared to data collected with a sealed-tube Cu anode source. Measurements were made on a synchrotron undulator beamline at an energy of 45 keV using Weissenberg flat-cone geometry and a storage phosphor (image) plate to detect the scattered X-rays. Advantages of the method include: extension of the accessible diffraction space to both higher and lower wavevectors, the ability to use crystals of irregular shape without the need for complicated absorption corrections, less need to prepare sample surfaces carefully, and the ability to filter fluorescence simply.

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